Journal Article10.1016/J.ENGANABOUND.2007.12.003
Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
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TL;DR: In this paper, a boundary element formulation is generalized for modeling electrostatic force microscopy (EFM) and related techniques, which is able to predict measurable quantities (e.g., capacitance, force, force gradient) due to probe-sample electrostatic interactions, provided that the relevant sample properties (surface topography and trapped charge distributions) are prescribed.
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Abstract: A boundary element formulation is generalized for modeling electrostatic force microscopy (EFM) and related techniques. This formulation is able to predict measurable quantities (e.g., capacitance, force, force gradient) due to probe–sample electrostatic interactions, provided that the relevant sample (conductive or dielectric) properties (surface topography and trapped charge distributions) are prescribed. For a certain voltage bias applied between the EFM probe tip and a sample of interest, the Coulombic force and force gradient can be computed via the Maxwell stress tensor and implicit differentiation, respectively. The numerical scheme can be employed to quantify EFM images and analyze sample surfaces.
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Citations
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review.
TL;DR: This review discusses the applications of force-sensitive voltage modulated scanning probe microscopy (SPM) for probing electrical phenomena at solid-liquid interfaces and describes the working principles behind electrostatic and Kelvin probe force microscopies (EFM & KPFM) at the gas-solid interface.
91
Adhesion hysteresis from interdependent capillary and electrostatic forces.
TL;DR: By biasing the surfaces, nonadditivity is demonstrated between the capillary and electrostatic forces at the onset of condensation, which holds important implications on the interpretation of force in nanoprobe geometries in humid atmospheres.
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Precise Modeling of Electrostatic Interactions with Dielectric Samples in Kelvin Probe Force Microscopy
Ali Sadeghi
- 01 Jan 2018
TL;DR: In this article, the capacitance and its first and second vertical gradients are derived for a spherical model tip atop thin or thick dielectric layers coated on a flat electrode.
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A Generalized Scalar Potential Integral Equation Formulation for the DC Analysis of Conductors
Shashwat Sharma,Piero Triverio +1 more
TL;DR: In this paper , a more general boundary element method based on the electric scalar potential is proposed for modeling conductive objects in various scenarios in a unified manner, where application-specific assumptions are not made, and the aforementioned operator null space is handled in an intuitive and rigorous manner.
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References
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TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
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Kelvin probe force microscopy
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Hans-Jürgen Butt,Manfred Jaschke +1 more
TL;DR: In this paper, the authors calculated the thermal noise of a cantilever with a free end by considering all possible vibration modes of the cantilevers and showed that if the end is supported by a hard surface, no thermal fluctuations of the deflection are possible.
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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
TL;DR: In this paper, a modified version of the atomic force microscope is introduced that enables a precise measurement of the force between a tip and a sample over a tip-sample distance range of 30-150 A.
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