Patent
Substrate exposure device and substrate exposure method
Hidetoshi Tabata,秀敏 田端 +1 more
- 21 Feb 2006
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TL;DR: In this paper, the authors proposed a substrate exposure device for exposing a large thin substrate and capable of performing exposure with high accuracy without requiring a preliminary positioning mechanism which employs a system of pressing and deforming an end face of a substrate to impart load.
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Abstract: PROBLEM TO BE SOLVED: To provide a substrate exposure device and a substrate exposure method suitable for exposing a large thin substrate and capable of performing exposure with high accuracy without requiring a preliminary positioning mechanism which employs a system of pressing and deforming an end face of a substrate to impart load. SOLUTION: The device is equipped with: an exposure optical system 22; an exposure table 16; an exposure frame 19 supporting a mask via a light transmitting plate; a first imaging means 27 imaging alignment marks M1, M2; a second imaging means 23 imaging at least three sides of the mask through the light transmitting plate; an illuminating means for the second imaging means; and a controlling means 25 which analyzes an image taken by the second imaging means, controls the exposure table to preliminarily position the substrate so that the substrate and the alignment marks 24 of the mask are within the view field of the first imaging means, as well as analyzes an image taken by the first imaging means and controls the exposure table to align the alignment mark of the substrate and the alignment mark of the mask. COPYRIGHT: (C)2007,JPO&INPIT
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Citations
Patent
Pattern forming apparatus and pattern forming method
Masafumi Kawagoe,Mikio Masuichi,Tomoyuki Komura,Ueno Hiroyuki,Miyoshi Nakajima +4 more
- 07 Aug 2012
TL;DR: A pattern forming apparatus consists of a first holder which holds a blanket carrying a pattern forming material on one surface in a horizontal posture with a carrying surface for the pattern formed material faced up, and a second holder who holds a plate for patterning the pattern or a substrate, to which a pattern is transferred, as a processing object such that the processing object is proximate to and facing the carrying surface of the blanket held on the first holder as mentioned in this paper.
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Patent
Pattern formation method and pattern formation device
Ueno Hiroyuki,Michifumi Kawagoe,Mikio Masuichi,Shoji Kazuhiro,Shibafuji Yayoi,Ueno Mika,Kazutaka Taniguchi +6 more
- 19 Sep 2013
TL;DR: In this paper, a pattern formation technique for forming the pattern layer by patterning of the application layer supported by the support body such as a blanket by the plate is proposed, where a plate is carried in to an upper stage portion (step S3), a blanket supporting an application layer is carried into a lower stage portion and sucked and held by a suction plate.
1
Patent
Aligner and exposure method
Kuga Masaichi
- 28 Oct 2010
TL;DR: In this paper, an alignment adjusting part adjusts relative positions in a top view of the photomask 1 and the wafer 3 from a position between the photosmask 2 and the Wafer 3.
References
Patent
Proximity exposure apparatus
Saida Masahiro
- 23 Mar 2006
TL;DR: In this paper, the authors propose a control that stores a measurement result of the position of the under surface of the mask M by a gap sensor 31 when a substrate stage 2 is separated from the mask by a predetermined distance and sets the result to a reference value.
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Patent
Positioning apparatus and method, coating equipment and method
Tokuo Hisada,Yasuki Shimizu,徳夫 久田,泰樹 清水 +3 more
- 19 Mar 2003
TL;DR: To provide a positioning apparatus by which the time for positioning a substrate can be reduced, and which is less costly and is applicable to the substrates of various sizes to be used.
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Patent
Proximity exposure apparatus
Kamiyama Tsutomu,Koyagi Yasuyuki,Hisaoka Katsuyuki,Tagashira Akira,Wada Yasuyuki +4 more
- 22 Sep 1994
TL;DR: In this paper, the authors propose a proximity apparatus that can detect the position deviation at the intended detecting position and can perform prealignment, which is performed under the state, wherein the substrate is supported with a sucking and supporting part 7a of a substrate carrier 7 at an input position LP.
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Patent
Method for producing semiconductor device
Tojo Junichiro,Saito Shinsuke +1 more
- 12 Mar 2002
TL;DR: In this paper, a photomask with plural transparent windows on a peripheral part of a wafer is used to correct the alignment of the wafer and the photomasks in first pattern formation.
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Patent
Pre-alignment of mask and wafer
Tanaka Ryoji,Kono Hidekazu,Iwata Joji +2 more
- 24 Apr 1989
TL;DR: In this paper, a TV camera was used for fine alignment of a mask and a wafer in order to decrease the load of final fine alignment and facilitate the manufacturing of masks.
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