Patent
Precision measuring method for micro-pattern contour information on three-dimensional curved surface
Jianguo Liu,Jun Ai,Zeng Xiaoyan,Zhongli Qin +3 more
- 10 Nov 2017
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TL;DR: In this paper, a precision measuring method for the micro-pattern contour information on a three-dimensional curved surface is proposed, which comprises the steps of coating the flexible material on the surface of a 3D curved surface, spreading the flexible materials printed with micro patterns on a flat substrate after the flexiblematerial is cured, wherein the micro pattern-printed side of the flexible surface is placed upwards, and measuring the micro patterns printed on the flexible substrate spread on the flat substrate to obtain the contours information of the micropatterns on the 3D curve surface.
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Abstract: The invention discloses a precision measuring method for the micro-pattern contour information on a three-dimensional curved surface The method comprises the steps of coating the flexible material on the surface of a three-dimensional curved surface; spreading the flexible material printed with micro patterns on a flat substrate after the flexible material is cured, wherein the micro pattern-printed side of the flexible material is placed upwards; measuring the micro patterns printed on the flexible material spread on the flat substrate to obtain the contour information of the micro-patterns on the three-dimensional curved surface According to the invention, the curved surface pattern contour information is transferred to the flexible material, and then the flexible material is spread into a plane for measurement Therefore, the test result is accurate and reliable, and the operation is relatively simple and convenient Moreover, the method can be used for measuring the contour information of micro patterns on a large-curvature curved surface or even any free curved surface
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Citations
Patent
Real-time monitoring optical path system for micro-nano structure appearance in ink-jet printing
Hao Lyu,Qin Hantang,Zhang Xiao +2 more
- 11 Jun 2019
TL;DR: In this paper, a real-time monitoring optical path system for micro-nano structure appearance in ink-jet printing is proposed, where a light beam sent by a laser device is subjected to light beam energy regulation through an attenuator, the light beam passes through a printing sample and then orderly passes through first convex lens and a secondconvex lens, light finally is converged at a CCD camera, the camera is connected with an external computer, a printing structure on the printing sample can be observed in real time through the computer, and according to difference
References
Patent
Rete cutting device and rete thickness measurement system
Yang Chi
- 10 May 2017
TL;DR: In this article, the utility model discloses a rete cutting device and rete thickness measurement system, which include: the supporting structure, install the motion on the support structure, at least one installs the cutting member on the motion, and connected the drive arrangement who just is used for driving the motion with the motion.
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