Patent
Low-temperature type hardness meter
Maeda Toyoichi,Kono Toshiyuki +1 more
- 21 Jun 2007
1
TL;DR: In this paper, a low-temperature type hardness meter capable of certainly preventing the adhesion of frost to the surface of a sample at the time of measurement of hardness at a low temperature by housing a hardness meter body in a hermetic closure is presented.
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Abstract: PROBLEM TO BE SOLVED: To provide a low-temperature type hardness meter capable of certainly preventing the adhesion of frost to the surface of a sample at the time of measurement of hardness at a low temperature by housing a hardness meter body in a hermetic closure using a high capacity globe box without internally evacuating the hardness meter body SOLUTION: The low-temperature type hardness meter 1 is equipped with a gas supply means (an Ar gas source 5, a nozzle 6, etc) for blowing a high-purity gas, which has a dew point temperature lower than the sample W against the sample W fixed on a sample stand 10 and the whole of the hardness meter 1 is housed in a gas replacing simple case 4 into which the high-purity gas is supplied Accordingly, even if a slight amount of the open air penetrates in the gas replacing simple case 4, a gas which has a dew point temperature lower than the temperature of the sample W and keeps the moisture content below the saturated steam pressure (amount) at the surface temperature of the sample W comes into contact with the surface of the sample W, so that the adhesion of frost to the surface of the sample W can be prevented COPYRIGHT: (C)2007,JPO&INPIT
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Citations
Patent
Material cooling device, hardness tester, and method of testing hardness
Nomoto Akiyoshi,Nishida Kenji,Doi Kenji,Soneta Naoki +3 more
- 14 Apr 2011
TL;DR: In this paper, a cooling control unit 14f circulates a refrigerant to a hollow unit of a hollow cooling stage 14a for supporting the sample S to cool the sampleS.
1
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Frederick I. Linker,Michael D. Kirk,Peter R. Swift,John Alexander,Sang-Il Park,Sung-Il Park,Ian R. Smith,David M. Parish,Jeong Ho Lee,Rebecca S. Howland +9 more
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TL;DR: In this article, a scanning probe microscope has been described, which includes a linear position-sensitive photodetector in the deflection sensor and a motorized, non-stacked x,y coarse movement stage.
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Probe device and proving method
Amamiya Hiroshi
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TL;DR: In this article, a probe device is provided with a loading chamber 1 with a pincette 3 and it carries a wafer W, a prober chamber 2 having a main chuck 5, which is located contiguous to the loaded chamber 1 and carries the wafer to the directions of X, Y, Z and θ.
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Patent
Miniature hardness tester
Yamamoto Yasunori
- 28 Mar 1997
TL;DR: In this paper, a miniature hardness tester for measuring the hardness of a sample TP by driving indenters 15 to press the sample TP, discriminating means 6 discriminates whether disturbance is operated at the indenters or not from the difference of the displaced amounts of the two indenters detected at different timings.
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Patent
Microhardness measuring method
Kenichi Kanazawa,Miwa Yasuo,Ito Takeshi,Konakawa Ryohei,Osamu Tsuji +4 more
- 15 Aug 1997
TL;DR: In this paper, the authors proposed a method to allow hardness calculated by a Cavity depth measuring system to coincide with hardness measured by a diagonal length measuring system and to allow measured hardness to coincide regardless of the load applied to a pressure element.
4
Patent
Method and device for measuring indentation depth of spherical indenter
Miyajima Tatsuya,Sakasai Mototsugu +1 more
- 16 Sep 2004
TL;DR: In this paper, a method of measuring the indentation depth of a spherical indenter into the surface of a sample is described, in which one transparent sphere is used as the spherical ingenter and a laser coupling lens to be arranged on the optical axis of both of a laser light source and a light detecting sensor, a test sample, a laser beam radiation surface and the laser beam detecting surface are fixed and the transparent spheres is displaced in order to press the transparent sphere into a sample and light power measured by the light detecting sensors is inereased and decreased by causing axial shift
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