Distinguishing foreign surface features from native surface features

Patent

Distinguishing foreign surface features from native surface features

- 19 Sep 2013

13

TL;DR: In this article, an apparatus, including a photon detector array, and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of pixels scattered in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features from foreign native features of the article.

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Citations

Patent

Surface features characterization

Joachim Ahner, +3 more

- 28 Jun 2013

TL;DR: In this article, an apparatus, including a photon detector array configured to receive photons scattered from features in a surface of an article, and a characterization means for characterizing the features in the surface of the article, was presented.

...read moreread less

16

Patent

Classification of surface features using fluoresence

Joachim Ahner, +6 more

- 19 Sep 2013

TL;DR: In this article, an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surfaces features, wherein the processing means is further configured for classifying the surface feature.

...read moreread less

15

Patent

Reflective surfaces for surface features of an article

Joachim Ahner, +3 more

- 17 Sep 2013

TL;DR: In this article, an apparatus including a photon emitter configured for emitting photons onto a surface of an article, a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article, and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of article.

...read moreread less

14

Patent

Chemical characterization of surface features

Joachim Ahner, +6 more

- 19 Sep 2013

TL;DR: In this article, an optical characterization device and a photon detector array are configured to sequentially receive a first set of photons from surface features of an article and a second set of photon scattered from the surface features.

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13

Patent

Surface features by azimuthal angle

David M. Tung, +1 more

- 03 Dec 2013

TL;DR: In this paper, an apparatus, including a photon emitting means configured to emit photons onto a surface of an article at a number of azimuthal angles, and a processing mean configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article, was presented.

...read moreread less

13

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