The invention belongs to the field of electron microscope microscopic imaging and image processing, particularly relates to a scanning electron microscope transmission mode and transmission electron microscope combined virus rapid detection system, method and device, and aims to solve the problems of complex virus detection operation and low imaging efficiency and detection accuracy based on a transmission electron microscope in the prior art. The system comprises: a sample acquisition module, which is configured to acquire a virus specimen to be detected and drop the virus specimen on a copper net with a support film; the scanning electron microscope imaging module that is configured to obtain a scanning electron microscope transmission image; the pixel position acquisition module that isconfigured to acquire the pixel positions of the virus particles and the vertexes of the copper grid grids corresponding to the virus particles in the image; a transformation matrix calculation module configured to calculate a transmission transformation matrix mapped from an image pixel position to a transmission electron microscope physical coordinate; and the morphological structure detectionmodule that is configured to obtain a morphological structure of each virus particle. According to the invention, the detection operation is simplified, and the imaging efficiency and the detection accuracy are improved.

Scanning electron microscope transmission mode and transmission electron microscope combined virus rapid detection system

The invention relates to the technical field of optical measurement, and particularly discloses an object surface normal detection-based three-dimensional reconstruction method, which comprises the steps of obtaining an incident light image of the surface of a to-be-measured object; calibrating and calculating the incident light image to obtain an incident light equation; obtaining a reflected light image of the surface of the to-be-measured object; performing pose measurement and calculation processing on the reflected light image to obtain a reflected light equation; calculating and obtaining gradient information of light spots on the surface of the to-be-measured object according to the incident light equation and the reflected light equation; and performing three-dimensional reconstruction on the to-be-measured object according to the acquired gradient information of the plurality of light spots on the surface of the to-be-measured object. The invention further discloses a three-dimensional reconstruction device based on object surface normal detection, an object surface normal detection device and an object surface normal detection system. The three-dimensional reconstructionmethod based on object surface normal detection provided by the invention can improve the precision and efficiency of three-dimensional reconstruction.

Three-dimensional reconstruction method and device based on normal detection, detection device and system

The invention discloses a three-dimensional reconstruction method of a scanning electron microscope image. The method comprises the following steps that a threshold value of the number of images is set; a template area is selected for the first frame of the image captured by the SEM; the predefined step size is used to move the sample platform to obtain the real-time image, and the template regionof the first frame is used for template matching; the matched image is added into the matched image sequence; for the matching image sequence, the region of interest is selected and the modified Laplace transform is used to compute the focus measurement of each pixel; Gaussian interpolation is used to calculate the maximum focus measurement value of each pixel, and the height of the correspondingpoint is calculated according to the maximum focus measurement value to obtain the three-dimensional point cloud; according to the three-dimensional point cloud, the interpolation fitting is carriedout on the three-dimensional graphics to achieve the three-dimensional reconstruction.

A three-dimensional reconstruction method of a scanning electron microscope image

The present invention discloses a rapid correction method of scanning electron microscope image drift The method comprises the steps of: performing feature detection of a reference image of a scanning electron microscope; performing feature detection of real-time images of the scanning electron microscope; performing feature first matching of a feature detection result of the reference image anda feature detection result of the real-time image, and rejecting a mistake matching pair; calculating and obtaining a homography matrix between the reference image and the real-time image; performinghomography matrix frame mapping of feature points of the real-time image, rejecting the mistake matching pair again, and obtaining an accurate matching pair; and recalculating and obtaining a homography matrix between the reference image and the real-time image, and performing perspective transformation of the real-time image The rapid correction method is simple in algorithm and fast in speed, can achieve real-time feedback and is good in image drift correction effect

Rapid correction method of scanning electron microscope image drift

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A three-dimensional reconstruction method of a scanning electron microscope image

Rapid correction method of scanning electron microscope image drift