Uchida Ren

TL;DR: In this paper, three axial coordinate positions and the rotational position of electrode pads of chips to be inspected on a moving platform are controlled in such a manner that the electrode pads will correspond to the tip position of a plurality of probes, a large number of probes of a probe card, and electrode pads, whose positional accuracy after being cut is uneven, can be positioned with accuracy, thus largely increasing the number of chips for simultaneous contact.

TL;DR: In this paper, a device and a method for measuring a luminescent property are provided to reduce the time required for measurement while maintaining the accuracy of the measurement while reducing the measurement time.

TL;DR: In this article, a luminescence property measuring device and a method, capable of accurately and efficiently measuring luminecence properties of a plurality of light-emitting elements, is proposed.

TL;DR: In this paper, a probe card is provided with a plurality of probes for contact with each electrode pad, and a probe tip and electrodes based on images from the probe position detection camera and the pad positioning detection camera each position of the pad is detected, and based on the detected positions of the plurality of probe tips and the respective electrode pads, the moving table is set so that the electrode pads of the chips to be inspected correspond to the tip positions of probes 24.