Stefan Dilhaire
University of Bordeaux
159 Papers
1K Citations
Stefan Dilhaire is an academic researcher from University of Bordeaux. The author has contributed to research in topics: Integrated circuit & Thermal conductivity. The author has an hindex of 27, co-authored 150 publications. Previous affiliations of Stefan Dilhaire include Centre national de la recherche scientifique.
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Papers
Thermal properties of carbon fibers at very high temperature
Christophe Pradere,Jean-Christophe Batsale,Jean-Marc Goyheneche,René Pailler,Stefan Dilhaire +4 more
TL;DR: In this paper, the experimental thermal conductivity estimated by the indirect relation \lambda = a\rhoC_p is presented as a function of the temperature, and the influence of heat treatment on the thermal conductivities of carbon fibers is also described.
152
Correlating the Seebeck coefficient of thermoelectric polymer thin films to their charge transport mechanism
Ioannis Petsagkourakis,Eleni Pavlopoulou,Eric Cloutet,Yan Fang Chen,Xjianjie Liu,Mats Fahlman,Magnus Berggren,Xavier Crispin,Stefan Dilhaire,Guillaume Fleury,Georges Hadziioannou +10 more
TL;DR: In this article, the authors investigated the dependence of Seebeck coefficient on charge carrier mobility for the first time in organic electronics and reported a concurrent increase of S and σ and experimentally derived the dependence on seebeck coefficient.
89
Dynamic Surface Temperature Measurements in ICs
Josep Altet,Wilfrid Claeys,Stefan Dilhaire,Antonio Rubio +3 more
- 25 Sep 2006
TL;DR: The paper is arranged as a survey of techniques oriented towards measuring the temperature dynamics of the circuit surface, presenting and discussing both the merits and drawbacks of each technique with regard to the accuracy, reliability and efficiency of the measurements.
84
Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films
Ioannis Petsagkourakis,Eleni Pavlopoulou,Giuseppe Portale,Bryan A Kuropatwa,Stefan Dilhaire,Guillaume Fleury,Georges Hadziioannou +6 more
TL;DR: Probing the thin film structure by Grazing Incidence Wide Angle X-ray Scattering has shown that this behavior is dictated by the structural properties of the PEDOT:Tos films; specifically by thethin film crystallinity combined to the preferential edge-on orientation of thePEDOT crystallites.
Thermal exchange radius measurement: application to nanowire thermal imaging.
TL;DR: This paper presents an experimental procedure, based on the 3omega-SThM method, to evaluate the thermal exchange radius of two commercial probes and shows that a new probe constituted of a palladium film on a SiO(2) substrate can reach a spatial resolution better than 100 nm whereas the Wollaston probe hardly reaches a submicronic spatial resolution.
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