PURPOSE:To obtain a high-speed pattern generator, by providing plural control parts for program processing for a data memory part which generates pattern data and by performing the access operation for the memory and the processing operation for read data in parallel simultaneously. CONSTITUTION:A pattern generator consists of a control part A with control memories 11-13 as main components and a data memory part B for pattern generation. Program data stored in control memories 11-13 are stored in buffer registers 15-17 by the address set to an address register 22. Data of buffer registers 15-17 are selected by a data multiplexer 18. A control part 19 reads out contents of a data memory 14 in accordance with selected data, and simultaneously, contents of the address register 22 are updated, and data of control memories 11-13 are stored in buffer registers 15-17.

High-speed pattern generator

PURPOSE:To reduce the work load of the preparation of an algorithmic test pattern, and to shorten the test time by providing a constitution wherein an ordinary random pattern generator and an operating means for preparing the data of the test pattern which performs the algorithmic operation are appropriately switched. CONSTITUTION:In addition to the ordinary random test pattern generator 11, the operating means 20 for preparing the data for the test pattern which performs the algorithmic operation is provided. Information from said pattern generator 11 and the operating means 20 is switched by a multiplexer 19, and guided to resistors 16 and 17 in the next stage. In this constitution, the work load for programming the algorithmic test pattern is reduced, and the tests, which have required test patterns of large capacity in the conventional method, can be performed by the extremely few patterns. Therefore the pattern transfer time during the execution of the test can be reduced, and the test time can be reduced to the large extent.

Lsi test pattern generating part

PURPOSE:To obtain simultaneously many annular steel ingots by disposing many cylindrical casting molds into a concentrical shape to form plural annular spaces then casting a molten steel at one time into the mold by a bottom pouring method. CONSTITUTION:The cylindrical casting mods 2, 4, 6 disposed with the heat insulting materials 3, 5, 6 on an ingot mold stool 1 are concentrically set. The molten steel 8 is then cast by bottom pouring through a pouring pipe 9 and a flow-off 10 into the two annular spaces formed of the stool 1 and the materials 3, 5, 6. A heat insulting material 11 is charged atop the molten steel after casting up to the prescribed height to complete the casting. The intermediate mold 4 contacts on both sides with the molten steel via the heat insulating material 5 and therefore the heat insulation is more intensified than the outer mold 3 and the increase in the casting height is made possible. The many annular steel ingots having different shapes are made obtainable at one time by the above-mentioned method.

Production of unidirectionally solidified annular steel ingots

PURPOSE:To enable the addressing and the sequential reading for a test pattern based on a sequence information read out by memorizing into a separate sequence information memory the sequence information on reading out the test pattern in the form of a specified compressed address. CONSTITUTION:Only information required to successively generate addresses of test patterns is memorized into a sequence memory as sequence information in the form of a compressed address. This address corresponds to the address of the test pattern one for one. The symbol l indicates information in the form of a compressed address and, for example, continuous sequence information NOP is represented by single sequence information NOP until. Therefore, as the memory capacity of the sequency information in the form of a compressed address can be reduced drastically, a small and fast memory can be used for the sequence information memory to separate it from a memory for storing test patterns thereby ensuring a high speed operation and a high economy.

Test pattern reading control system

PURPOSE: To simplify writing and execution of a test program by providing a memory circuit for storing a data of nonsequential vector, and a memory circuit for storing a data of sequential vector having higher capacity. CONSTITUTION: In order to perform high speed control of digital test pattern, a first memory circuit 19 having a data RAM 82 for storing a data of nonsequential vector is provided. A second memory circuit having a sequential data memory for storing a block of sequential vector data is also provided and the memory capacity thereof is set higher than that of the memory circuit 19. A format setting system 22 receives a data from the RAM 82 or the sequential data memory and produces an input to a circuit under test from that data. A sequence controller 18 controls two memory circuits and routes the data from RAM 82 or the sequential data memory selectively to the format setting system 22.

Automatic circuit tester control system

PURPOSE: To eliminate occurrence of idle time when switching regular and irregular patterns to each other by applying a patttern having both regular and irregular pattern signals being mixed within to a check element. CONSTITUTION: The pattern generator 13 of a main pattern generator 9 applies a regular pattern signal through data multiplexers 22aW22c to a tested element DUT by a command from an instruction memory 10. The start address stack 19 of an auxiliary pattern generator 9', on the other hand, applies, when reading an irregular pattern production command from the memory 10, a start address to an address counter 18 to output an irregular pattern signal from an auxiliary memory 17 to the multiplexers 22aW22c. When a flip-flop FF16 is set by an operation start signal 37 to produce a signal 38, the output from the memory 17 is applied to the DUT. When the address from a stop address stack 20 becomes coincident to the address of the counter 18 in a comparator 21, the flip-flop FF16 is reset to thereby allow the output of a generator 13 to be applied to the DUT. COPYRIGHT: (C)1980,JPO&Japio

Pattern signal generator

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Pattern signal generator