Nobuyuki Otsuka
Panasonic
158 Papers
1.1K Citations
Nobuyuki Otsuka is an academic researcher from Panasonic. The author has contributed to research in topics: Layer (electronics) & Semiconductor. The author has an hindex of 17, co-authored 158 publications.
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Papers
A DC-isolated gate drive IC with drive-by-microwave technology for power switching devices
Shuichi Nagai,Noboru Negoro,Takeshi Fukuda,Nobuyuki Otsuka,Hiroyuki Sakai,Tetsuzo Ueda,Tsuyoshi Tanaka,Daisuke Ueda +7 more
- 03 Apr 2012
TL;DR: The recent technology of wireless power transmission using an electromagnetic resonant coupler with an open-ring resonator is focused on, which is very attractive due to its high efficiency in power transmission and its compactness at high frequency.
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Patent
Nitride semiconductor, method for manufacturing the same and nitride semiconductor device
Yasutoshi Kawaguchi,Akihiko Ishibashi,Ayumu Tsujimura,Nobuyuki Otsuka +3 more
- 28 Jan 2003
TL;DR: In this article, a facet-forming layer made of nitride semiconductor containing at least aluminum is formed on a substrate made of gallium nitride (GaN), and a selective growth layer laterally grows from the inclined facet surface.
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Patent
Nitride-based semiconductor device and manufacturing method
Akihiko Ishibashi,Yasutoshi Kawaguchi,Nobuyuki Otsuka,信之 大塚,靖利 川口,明彦 石橋 +5 more
- 03 Jul 2001
TL;DR: In this paper, the authors proposed a manufacturing method of a laser beam resonator having high reproducibility and yields by forming a separation groove where flatness on a section is excellent on an AlGaInN-based crystal substrate.
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Room Temperature 339 nm Emission from Al0.13Ga0.87N/Al0.10Ga0.90N Double Heterostructure Light-Emitting Diode on Sapphire Substrate
TL;DR: In this paper, a double heterostructure light-emitting diodes (LEDs) on (0001)-oriented sapphire substrate was operated at a peak emission wavelength of 339 nm with a narrow linewidth of 5.6 nm and the dependence of emission intensity on injection current suggests that nonradiative recombination was suppressed and the diffusion current for the recombination process was dominant at the injection current of over 20 mA.
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Patent
Method for fabricating nitride semiconductor, method for fabricating nitride semiconductor device, and nitride semiconductor device
Akihiko Ishibashi,Ayumu Tsujimura,Yoshiaki Hasegawa,Nobuyuki Otsuka,Gaku Sugahara,Miyanaga Ryoko,Shimamoto Toshitaka,Harafuji Kenji,Ban Yuzaburo,Kiyoshi Ohnaka +9 more
- 27 Dec 2001
TL;DR: The method for fabricating a nitride semiconductor of the present invention includes the steps of: (1) growing a first semiconductor layer made of a first group III nitride over a substrate by supplying a first Group III source and a group V source containing nitrogen; and (2) growing an area near the interface between the first and second semiconductor layers is grown so that the density of the p-type dopant locally increases as mentioned in this paper.
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