The history of integrated circuit (IC) development is another record of human challenges involving space. Efforts have been made to protect ICs from sudden malfunctions due to single-event effects (SEEs). These effects are triggered by only a single strike of particle radiation, such as an $\alpha $ -ray or cosmic ray, originating from our solar activity and galactic events including supernovas. This article explores how SEEs have evolved along with the progress in complementary metal-oxide-semiconductor (CMOS) digital IC technology, or device scaling, from the early micrometer-scale generations to the current nanometer-scale generations. For this purpose, focusing on basic digital elements, that is, inverters and static random access memories (SRAMs), this study collected more than 100 sets of data on four characteristic parameters of single-event upsets (SEUs) and single-event transients (SETs), both of which are undesired flips in digital logic states. The results show that all the examined parameters, such as the SEU critical charge, decrease with the device feature size. Analysis involving structure classification, such as bulk versus silicon-on-insulator (SOI) substrates and planar versus fin channels, reveals relationships between the examined SEE parameters and other device features such as the power supply voltage. All the data collected in this survey are explicitly given in tables for future exploration of IC reliability.

/pdf/scaling-trends-of-digital-single-event-effects-a-survey-of-4m7xdw8ngw.pdf

Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison With Transistor Performance

Although TB health promotion directed at policy makers and healthcare workers (HCWs) is considered important to tuberculosis (TB) control, no indicators currently assess the impact of such promotional activities. This article is the second in a series of papers that seek to establish a framework of behavioral indicators for outcome evaluation of TB health promotion, using the Delphi method. In the first article, we sought to establish a framework of behavioral indicators for outcome evaluation of TB health promotion among TB suspects and patients. The objective of this second article is to present an indicator framework that can be used to assess behavioral outcomes of TB health promotion directed at policy makers and HCWs. A two-round, modified Delphi method was used to establish the indicators. Sixteen experts who were knowledgeable and experienced in the field of TB control were consulted in Delphi surveys. A questionnaire was developed following 4 steps, and involved ranking indicators on a five-point Likert scale. The consensus level was 70 %. Median, mode, and Coefficient of variation (CV) were used to describe expert responses. An authority coefficient (Cr) was used to assess the degree of each expert’s authority. Consensus was achieved following the two survey rounds and several iterations among the experts. For TB health-promotion activities directed at policymakers, the experts reached consensus on 2 domains (“Resource inputs” and “Policymaking and monitoring behaviors”), 4 subdomains (“Human resources” among others), and 13 indicators (“Human resources per 100,000 person” among others). For TB health-promotion activities directed at HCWs, the experts reached consensus on 5 domains (“Self-protective behaviors” among others), 6 sub-domains (“Preventing infection” among others), and 15 indicators (“Average hours of daily workplace disinfection by ultraviolet radiation” among others). This study identified a conceptual framework of core behavioral indicators to evaluate TB health-promotion activities directed at policymakers and HCWs involved in TB control. Validation in other parts of the world could lead to global consensus on behavioral indicators to evaluate TB health promotion targeted at policymakers and HCWs.

/pdf/framework-of-behavioral-indicators-evaluating-tb-health-2qfsjllqyw.pdf

Framework of behavioral indicators evaluating TB health promotion outcomes: a modified Delphi study of TB policymakers and health workers

Single-event transient (SET)-induced soft errors are becoming a more significant threat to the reliability of electronic systems in space, especially for advanced technologies. The SET pulse width, which is vulnerable to SET propagation, is a critical parameter for developing SET mitigation techniques. This paper investigates the pulse-broadening effect in the process of SET propagation in logic circuits and the SET-sensitive region distribution in the layout using the pulsed-laser mapping technique in logic circuits implemented with 28 nm Ultra-Thin Body and BOX (UTBB) FDSOI technology. The experiments were carried out at the Naval Research Laboratory (NRL) to measure the SET-induced errors and map the SET-sensitive region distribution at various clock frequencies and laser energy levels. The results illustrate that the number of errors increases with the clock frequency and energy for combinational logic circuits and that the flip-flop SEU rate is less sensitive to clock frequency. The SET pulse-broadening effect was also observed using SET mapping for an OR gate chain at different laser energy levels. In addition, the simulation results revealed the mechanism of the SET pulse-broadening effect in an OR gate chain.

/pdf/single-event-transient-study-of-28-nm-utbb-fdsoi-technology-2vl7ub4o.pdf

Single-Event Transient Study of 28 nm UTBB-FDSOI Technology Using Pulsed Laser Mapping

Study of Radiation-Tolerant SRAM Design

Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs

Single Event Upsets in 28nm UTBB-FDSOI SRAM with several types of radiation hardened Bit-cells are studied by heavy ion irradiation test and TCAD simulation. Heavy-ion SEU cross section of the FDSOI SRAM cell are two decades lower than an equivalent cell in planar bulk technology as reported. Through the hardened design, the 8T bit-cells SRAM is able to reach the upset-immune for low LET heavy ions.

Study of SEU of 28nm UTBB-FDSOI Device by Heavy Ions and TCAD Simulation

Objective To investigate the situation of human resources of TB prevention and control system at district level in Beijing,and evaluate the fairness of demographic and geographic distribution of health resources.Methods All 326 professionals at 18 district level TB institutions were investigated by questionnaires from August to September in 2011,including their age,educational background,and professional title information.The data related to population and geographical acreage was also collected to estimate the fairness by Lorenz Curve and Gini Coefficient.Results Among the 326 TB professionals at the district level in Beijing,the mean age was(42.04±5.37) years.Most professionals were graduated from college or below,accounting for 74.85 %(244/326),undergraduate degrees accounted for 21.78%(71/326),master degrees accounted for 3.07%(10/326),no doctoral degrees.52.15%(170/326)staff had junior titles,40.18%(131/326) had medium level titles,and only 4.60%(15/326) had senior titles.The average service population per professional was 53 800,and service radius of 4.05 km.According to the demographic and geographic distribution,the Gini Coefficient is 0.49 and 0.62 respectively.Conclusion In Beijing district level TB institutions,the education of TB professionals was inadequate,number of staff with medium or senior title was low,and the staffing did not meet the fairness requirement in geographical and population distribution.Therefore,Beijing district level human resources need to be further strengthened.

Human resources survey and staffing assessment of Beijing district level tuberculosis institutions

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Study of SEU of 28nm UTBB-FDSOI Device by Heavy Ions and TCAD Simulation

Human resources survey and staffing assessment of Beijing district level tuberculosis institutions