A defect detecting method includes: an image acquiring process for capturing an image of an inspection object having an identical sequence of pattern and acquiring the image; and a defect emphasizing process for emphasizing a defect of the captured image. The defect emphasizing process includes: an inspected-point selecting process for sequentially selecting an inspection point on the captured image; and a defect emphasizing value calculating process for obtaining differences by subtracting from a luminance value of the selected inspection point each luminance value of a plurality of comparison points disposed around the inspection point and selecting one difference of the smallest value of the obtained differences in luminance to determine a defect emphasizing value of the inspection point.

Defect detecting method and defect detecting device

PROBLEM TO BE SOLVED: To provide an environment recognition device that reliably and properly detects and recognizes a light source existing on a vehicle travel path, from a captured image. SOLUTION: The environment recognition device 1 includes: an imaging means 2 which captures an image T; a distance detection means 6 which detects a real-space distance Z of each pixel p in the image T; an integration processing means 10 which integrates adjacent pixels p in the image T into one group g based on each image data D; a distance calculation means 11 which calculates a real-space distance Zg of each group g based on each pixel p belonging to the group g and the real-space distance Z corresponding to each pixel P*; and a light source detection means 12 which detects, when each of the size on the real space or height from road surface Yc-Y* of the group g based on the real-space distance Zg of each group, and the position of the group g with respect to the vehicle travel path on road surface satisfies a predetermined condition, the group as a light source S existing on the road. COPYRIGHT: (C)2011,JPO&INPIT

Environment recognition device

A surface inspection apparatus used as follows. An inspection object (10) is scanned by a camera (11) having a line image sensor (13) and image data obtained is input to calculation means (16). By using a line memory (17) and an adder (18), image data of two adjacent main scan lines are added to create an image data string. Pixel data in a block consisting of a plurality of pixels continuous in the main scan direction are added by a calculation processor (19) to create in−block addition data. A correlation value between the in−block addition data adjacent in the main scan direction is calculated. The correlation value is compared to a threshold value by judgment means (20), thereby obtaining the surface state of the inspection object (10).

Surface inspection apparatus and method

PROBLEM TO BE SOLVED: To provide a flaw detection method which enables the enhancement of the flaw detection sensitivity of an inspection target. SOLUTION: The flaw detection method has the flaw emphasis processing process for performing flaw emphasis processing with respect to the picked up image of the inspection target and the flaw detection process for detecting the flaw of the inspection target on the basis of the respective pixels obtained in the flaw emphasis processing process. The flaw emphasis processing process is equipped with the inspection target pixel selection process ST21 for successively selecting an inspection target pixel, the comparing target pixel group setting process ST22 for dividing a plurality of the comparing target pixels arranged to the periphery of the inspection target pixel so as to separate a predetermined distance into a plurality of comparing target pixel groups to set the comparing target pixel groups, the minimum brightness difference calculation process ST23 for calculating brightness difference data being the difference between the respective comparing target pixels of the comparing target pixel groups and the respective brightness values of the inspection target pixel and calculating the minimum brightness difference becoming minimum in the calculated value at every comparing pixel group, and the flaw emphasis value calculation process ST24 for setting the minimum brightness difference becoming the maximum in value of the minimum brightness differences calculated at every comparing pixel group. COPYRIGHT: (C)2009,JPO&INPIT

Flaw detection method and flaw detector

PROBLEM TO BE SOLVED: To provide a defect detection method and a defect detecting device, capable of accurately detecting display defects, such as voltage cause defects which can be generated in image, when a voltage is applied to an image display device. SOLUTION: A control device 6 of this defect detection device is equipped with an inspection image display control part 611 for displaying an inspection image, by driving the image display device with an inspection voltage value for driving, in a state where the voltage causing defects can be detected; a background image display control part 612 for displaying a background image by driving the image display device with a background voltage value for driving in the state where the voltage causing defect cannot be detected; an inspection image data acquisition part 613 for acquiring inspection image data by imaging the inspection image, a background image data acquisition part 614 for acquiring background image data by imaging the background image, a shading correction part 615 for generating differential image data between the inspection image data and the background image data, and a defect detection part 616 for detecting the display defect, based on the differential image data. COPYRIGHT: (C)2008,JPO&INPIT

Defect detection method and defect detecting device

PROBLEM TO BE SOLVED: To resolve a problem in application of a conventional pattern erasing process where a linear defect portion which should be left as a defect is erased by pattern erasure or a pattern is left when the pattern has dispersion of pattern pitches. SOLUTION: A concentration difference nearest to 0 is determined from respective concentration differences between a target picture element and a comparison picture element group A arranged on the same column as the target picture element and between the target picture element and a comparison picture element group B arranged in a direction perpendicular to the comparison picture element group A, a concentration difference farthest from 0 is determined by comparing a particular concentration difference to the comparison picture element group A and a particular concentration difference to the comparison picture element group B, and a pattern erased image of adding a maximum concentration difference to a reference concentration in a pattern erasure target image is generated.

Repetitive pattern erasing method, defect inspection method and device

PROBLEM TO BE SOLVED: To easily and efficiently process image by performing a pixel data processing to be required between pieces of partial pixel data held temporarily as being updated in real time. SOLUTION: This purpose is achieved by repeating successive pixel data processings for one piece of the pixel data D1a as shifting the pixels data D1a and a noticing pixel D3 for a group D8 of held pieces of the pixel data after a value obtained by holding the respective pixel data D1a as the group D8 of pieces of pixel data for a processed area, including a set of the relevant pixel D3 to which the pixel data processing is performed and comparison pixels D4 to D7 under time sequence, to repeat main scanning of the respective pieces of pixel data D1a of gradation image data D1 by every line in the sub-scanning direction and generating image data D2 for recognition corresponding to the gradation image data D1.

Image processing method and image processor

PROBLEM TO BE SOLVED: To perform labeling in real time by one time of scan when applying labeling processing to binary image data inputted by a raster scan system SOLUTION: A device is provided with a line buffer 6 for holding latest binary image input data for at least one line inputted before an object pixel at a present scan position, a label updating circuit 7 for extracting the pixel area of 2×2 matrix containing the object pixel from the data held in the line buffer, determining the start, continuation or end of a link area from a pixel value in the extracted pixel area and labeling the object pixel, and a label storage memory 12 for storing the information of the labeled link area, and a series of labeling processings are performed synchronously with an output signal provided from an image pickup device

Device and method for labeling

PROBLEM TO BE SOLVED: To reduce the memory capacity by limiting required storage data to the image data of a processing area and the data of a peak point being detected by each processing area. SOLUTION: Light through the hole of a body 1 to be inspected enters a line sensor camera 4. A built-in CCD line sensor is scanned in a direction B, thus picking up the image of a region 1A ranging from a starting point S to an ending point E. Due to the scanning in the direction B of the CCD line sensor and the traveling in a direction A of a carrying device 2, the image of the entire surface of the body 1 to be inspected is picked up by the line sensor camera 4 and an image signal is inputted via the input terminal of an image- processing device 5 from the output terminal. Image signals being obtained, for example, by five times of scanning of the CCD line sensor are converted into image data by an A/D converter 6. The image data include the position of a pixel and the data of brightness and the pixel row in the direction B can be obtained equivalent to five columns in the direction A by five times of scanning, thus inspecting the entire surface of the body 1 to be inspected. By analyzing the position data of all peak points being obtained, all holes of the body 1 to be inspected such as a shadow mask can be efficiently inspected.

Method and device for processing image

PROBLEM TO BE SOLVED: To provide a method for detecting pattern defect in which the processing quantity in the detection of defect by the comparison of a pattern to be inspected with a non-defective pattern is reduced to improve the inspection speed. SOLUTION: The inputted image of a pattern to be inspected is compared with the image of a non-defective pattern to detect the incompatible area, and the horizontal scanning directional and vertical scanning directional continuity of the pattern is also detected. The area where one end of the continuous area of the pattern is close to the compatible area, and the other end is not close to the non-defective pattern or the inspecting pattern is extracted, the area where the length of the continuous direction is less than a prescribed value is included in the compatible area to perform the processing, and the kind of defective is specified from the area where the length of the continuous area is the prescribed value or more.

Method for detecting pattern defect

Popular Tasks used by Researchers

How can I help with your research?

Get more enhanced response by uploading the PDFs you want me to reference.

No relevant PDFs in your library

SciSpace is the AI research assistant for academics. Run systematic literature reviews on 280M+ papers, and write papers with cited sources. Trusted by 1M+ students, PhDs & researchers.

SciSpace | AI for Research

We encountered an error while loading the panel. Please try refreshing the page.

Something went wrong

Analyze PDFs

Code & Manuscripts

Funding & Grants

Literature & Patents

Medical & Clinical Data

Systematic Review

Visualize & Present

Web & Data

Build a Google Scholar-like website for your research.

Build a website

Create charts and images for your research

Create a Chart

Write a paper for submission to a journal

Draft a manuscript

Patent Search

Design eye-catching scientific posters in minutes.

Scientific Poster Generation

Systematic Literature Review

Anyone with the link can view this chat. You can switch it back to private anytime.

One task is running at the moment. Your messages will be shown right after.

Drag and drop or click here to browse

Loved by <highlight>1 million+</highlight> researchers

Extract a list of specific topics and their sources from unstructured text

Topics

Compare and analyze relevant papers that matches with your search

Papers

Get insights from PDFs and bookmarked papers from your library

My library

Recent searches

Try searching for:

Catch AI-generated content in scholarly and non-scholarly content

{ai} Detector

Ai Writer

Get PDF Summaries, highlighted text explanations 

Chat with PDF

Effortlessly create in-text citations and bibliographies in APA and 2,500 other formats

Citation generator

Get explanations, summaries, and answers on academic papers

Ease up your research workflow with {scispace}'s cohort of exciting AI tools

Elevate your academic writing skills and convey your ideas the way you want

Paraphraser

Explore our range of reading and writing tools

Your file is being prepared and should be ready in a few minutes. If it's a large file, it might take a bit longer. You can close this window, and we'll email you the file when it's done.

You have reached a maximum limit of <strong>{limit}</strong> columns in the table. Remove at least <strong>1</strong> column to add or create another one.

Kawano Hajime

Author Tools

Chat about Author