Jian Chen
11 Papers
26 Citations
Jian Chen is an academic researcher. The author has contributed to research in topics: Laser & Polarizer. The author has an hindex of 3, co-authored 9 publications.
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Papers
Quantitative Evaluation of Subsurface Damage by Improved Total Internal Reflection Microscopy
TL;DR: In this article, an improved total internal reflection microscopy (TIRM) combined with digital image processing techniques is proposed to quantitatively inspect surface damage (SSD), having a great impact on the laser-induced damage threshold (LIDT).
24
Patent
Large-aperture ultra-smooth surface defect detection device and method
Shao Jianda,Liu Shijie,Dong Jingtao,Wu Zhouling,Jian Chen,Ni Kaizao,Xu Tianzhu +6 more
- 22 Feb 2017
TL;DR: In this paper, a large-aperture ultra-smooth surface defect detection device and method is presented, which mainly consists of a laser device, a laser beam expanding system, a high-reflectivity mirror, a polarizer, a polarization splitting prism, a 1/4 wave plate, a rotary prism and a telecentric field lens.
13
Patent
High-speed measuring device and method for surface scattering of large-aperture material
Shao Jianda,Liu Shijie,Dong Jingtao,Wu Zhouling,Jian Chen,Wang Shenghao,Ni Kaizao +6 more
- 15 Feb 2017
TL;DR: In this article, a high-speed measuring device and method for surface scattering of a large-aperture material is proposed, which consists of a laser device, a laser beam expanding system, a first high-reflectivity mirror, a polarizer, a polarization splitting prism, a 1/4 wave plate, a second highreflective mirror, rotating prism, galvanometer, a telecentric field lens, a measured sample, a scattered light detector, a reflected light detector and a line triggering detector.
3
Patent
Surface defect detection apparatus with high-speed laser line scanning
Shao Jianda,Liu Shijie,Dong Jingtao,Wu Zhouling,Jian Chen,Zhou You,Wang Weiwei +6 more
- 22 Feb 2017
TL;DR: In this paper, a surface defect detection system with high-speed laser line scanning is presented, which mainly consists of a laser, a laser beam expanding system, a polarizer, a second high-reflectivity mirror, a wave plate, a third highreflective mirror, rotary prism, a row trigger detector, a telecentric field lens, laser focusing lattice lines, a sample under test, a scattering light collector, a line array scattering light detector and a cylindrical lens.
3
Patent
Detection and classification device for surface defect of big-aperture optical element
Jian Chen,Zhouling Wu,Huang Ming +2 more
- 17 Jul 2013
TL;DR: In this article, a detection and classification device for a surface defect of a big-aperture optical element is presented, which is suitable for optical nondestructive inspection, optical precision detection and optical microscopic imaging and defect analysis.
3