A dual-energy ray imaging method and system. The method comprises: calculating the material mass thickness of an overlapped region of two materials using a calibrated curve surface fitting method; then decomposing a pair of pieces of original high and low energy data of a pixel into two sets of high and low energy data corresponding to the two materials; and finally, conducting a calculation to obtain decomposition results of different materials of each pixel. The method has the unique advantage that the problem of misrecognition of materials caused by forward and backward overlapping of the two materials can be eliminated, and the hierarchical imaging of various materials can be realized, thereby effectively improving the accuracy of substance recognition, reducing the false alarm rate and missing report rate, and having a very important significance on the application of same in fields such as safety inspection and customs anti-smuggling.

Dual-energy ray imaging method and system

A bundled object image selection system includes an array of sensors configured to at least partially surround a bundle of objects, wherein the sensors are lasers adapted to obtain physical dimensional data about the bundle. The system also includes at least one camera configured to obtain a plurality of images of the bundle, a processor for executing computer-executable instructions, and a memory for storing computer executable instructions. When the instructions are executed, the processor implements a limit module that processes the physical dimensional data to determine a limit of the bundle and a selection module that selects at least one image from the plurality of images corresponding to the limit.

System and Method for Image Selection of Bundled Objects

Disclosed is a method and device for estimating weight of an object to be inspected in an inspection system. An effective atomic number and a high-energy gray value of the dual-energy corresponding to each pixel of the object to be inspected are obtained by a dual-energy radiation scanning. A mass-thickness value for a corresponding pixel is obtained from a pre-created mass-thickness attenuation curve by utilizing the effective atomic numbers and the high-energy gray value of the dual-energy for respective pixels. Weight information for at least a part of the object to be inspected is calculated by multiplying the mass-thickness value by the area of the pixel. Such a method may accurately calculate the weight of the object to be inspected and save the cost for a conventional weighing hardware.

Methods and devices for estimating weight of an object to be inspected in an inspection system

System and method for image selection of bundled objects

There is provided a method for assigning an attribute to an unknown object overlapping with a predetermined background object. The unknown object is scanned overlapping with the background object within an x-ray scanning device to obtain a plurality of dual-energy attenuation images having attenuation information representing the background object and an overlap region wherein the background object and the unknown object overlap. The dual-energy attenuation images are decomposed into reference material equivalent path length images. The reference material equivalent path lengths representing the background object in the overlap region are determined and eliminated from the overlap region to provide reference material equivalent path length images having first and second reference material equivalent path lengths through only the unknown object.

Methods for removing a background object from an image

A first image including a projection of a portion is generated based on data representing attenuation of higher-energy radiation having a peak energy of at least 1 MeV that passes through a portion of an inspection volume. A second image including a projection of the portion is generated based on data representing attenuation of lower-energy radiation passing through the portion of the inspection volume. A dual-pixel image is created from the first image and the second image. A region of interest is selected from the dual-pixel image. A first basis function that is derived from an attenuation characteristic associated with the region of interest is selected. The region of interest is represented in terms of an amplitude associated with the first basis function and an amplitude associated with the second basis function.

Examination of a region using dual-energy radiation

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Examination of a region using dual-energy radiation