J. Geurts
University of Würzburg
73 Papers
514 Citations
J. Geurts is an academic researcher from University of Würzburg. The author has contributed to research in topics: Raman spectroscopy & Raman scattering. The author has an hindex of 15, co-authored 73 publications.
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Papers
Zinc Oxide 120
Claus F. Klingshirn,B.K. Meyer,Andreas Waag,Axel Hoffmann,J. Geurts +4 more
- 01 Jan 2010
324
In situ electrical characterization of DH4T field-effect transistors
TL;DR: In this paper, an in situ electrical analysis of organic thin film transistors (OTFTs) during the deposition of the active layer of dihexylquaterthiophene (DH4T) is presented.
95
Raman monitoring of semiconductor growth
TL;DR: In this article, an ultra-high-vacuum chamber was designed to suit molecular beam epitaxial growth as well as simultaneous optical measurements utilizing a multichannel detection Raman system.
60
Optimized sub-micron organic thin-film transistors: the influence of contacts and oxide thickness
M. Leufgen,U. Bass,T. Muck,T. Borzenko,Georg Schmidt,J. Geurts,Veit Wagner,Laurens W. Molenkamp +7 more
TL;DR: In this article, the authors presented a systematic study of transistors based on vacuum-deposited dihexylquaterthiophene (DH4T), an n-type Si gate, a SiO 2 insulator layer and metal drain/source contacts with channel lengths from 50μm down to 50nm.
46
Surface phonons of the Si(111)-( 7 × 7 ) reconstruction observed by Raman spectroscopy
Martin Liebhaber,U. Bass,P. Bayersdorfer,J. Geurts,E. Speiser,J. Räthel,Arne Baumann,S. Chandola,Norbert Esser +8 more
TL;DR: In this paper, the surface phonon modes of the reconstructed Si(111)-($7\ifmmode\times\else\texttimes\fi{}7$) surface by polarized Raman spectroscopy were studied.
29