Haiming Li
North China Electric Power University
6 Papers
1 Citations
Haiming Li is an academic researcher from North China Electric Power University. The author has contributed to research in topics: Voltage & Line (electrical engineering). The author has an hindex of 1, co-authored 6 publications.
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Papers
Simulation of Electric Field Distribution in Cable Joint under the Influence of Metal Particle
Wu Zheng,Mingyan Wu,Ruxin Zhang,Lei Liao,Gang Du,Xueyou Huang,Jin Wenpei,Jian Zhang,Haiming Li,Binxian Lu +9 more
- 01 Mar 2020
TL;DR: In this paper, an accurate model is established to accurately calculate the distribution of electric field around particles in the whole model, and the error in the central region of the model is less than 6.5%.
2
Patent
Tandem type alternating-current high-voltage bus measuring device and method
Binxian Lu,Jian Zhang,Haiming Li,Li Guang,Li Binshuai,Yao Hui,Yang Junjia +6 more
- 12 Jun 2020
TL;DR: In this paper, a tandem type alternating-current high-voltage bus measuring device is presented, which consists of an incoming line connecting assembly, an outgoing line connected assembly, a highvoltage conductor, a metal shell, and a measuring assembly.
Patent
Cable elbow-shaped terminal transient voltage online monitoring device and method
Binxian Lu,Haiming Li,Jian Zhang,Gao Shan +3 more
- 04 Dec 2020
TL;DR: In this article, a cable elbow-shaped terminal transient voltage online monitoring device and method is described, which consists of a pluginsulation structure, a thread structure arranged at one end of the plug insulation structure and a measurement transmission device arranged at the other end of plug insulation.
Research on Simulation Methods of Electric Field Intensity on Surface of 10 kV Cable Joint
Ruxin Zhang,Jun Xiong,Wu Zheng,Lei Liao,Mingyan Wu,Gang Du,Xueyou Huang,Jin Wenpei,Haiming Li,Jian Zhang,Wenli Cheng,Binxian Lu +11 more
TL;DR: In this paper, the average electric field intensity (EFI) of the inner surface of the outer semi-conducting shield can be calculated from the current in the measuring circuit.