Fuguo Li
Xidian University
10 Papers
95 Citations
Fuguo Li is an academic researcher from Xidian University. The author has contributed to research in topics: Epitaxy & Thin film. The author has an hindex of 6, co-authored 10 publications.
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Papers
Comparison Study of β-Ga2O3 Photodetectors Grown on Sapphire at Different Oxygen Pressures
Lu Huang,Qian Feng,Genquan Han,Fuguo Li,Xiang Li,Fang Liwei,Xing Xiangyu,Jincheng Zhang,Yue Hao +8 more
TL;DR: In this article, a photodetector was grown on sapphire utilizing the laser molecular beam epitaxy tool and the impact of oxygen pressure in growth chamber on the crystal quality, surface morphology, chemical component, and electrical performance of the photoder.
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Comparison Study of $\beta $ -Ga 2 O 3 Photodetectors on Bulk Substrate and Sapphire
Qian Feng,Lu Huang,Genquan Han,Fuguo Li,Xiang Li,Fang Liwei,Xing Xiangyu,Jincheng Zhang,Wenxiang Mu,Zhitai Jia,Daoyou Guo,Weihua Tang,Xutang Tao,Yue Hao +13 more
TL;DR: In this article, the authors reported that the Ga2O3 photodetector epitaxially grown on sapphire achieves a blueshift of bandgap in comparison with the bulk device.
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The properties of gallium oxide thin film grown by pulsed laser deposition
Qian Feng,Fuguo Li,Dai Bo,Zhitai Jia,Xie Wenlin,Xu Tong,Xiaoli Lu,Xutang Tao,Jincheng Zhang,Yue Hao +9 more
TL;DR: In this article, the influence of oxygen pressure on crystal quality, surface morphology and transmittance were investigated by means of X-ray diffraction (XRD), atomic force microscope (AFM) and spectrophotometer.
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Band alignment of SiO 2 /(Al x Ga 1-x ) 2 O 3 (0 ≤ x ≤ 0.49) determined by X-ray photoelectron spectroscopy
Zhaoqing Feng,Qian Feng,Jincheng Zhang,Xiang Li,Fuguo Li,Lu Huang,Hong-Yan Chen,Hong-Liang Lu,Yue Hao +8 more
TL;DR: In this article, the authors investigated the band alignment of SiO2/(AlxGa1-x)2O3 (0.49) interfaces using high-resolution X-ray diffraction measurements.
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Optical properties of (Al x Ga 1-x ) 2 O 3 on sapphire
Zhuangzhuang Hu,Qian Feng,Jincheng Zhang,Fuguo Li,Xiang Li,Zhaoqing Feng,Chunfu Zhang,Yue Hao +7 more
TL;DR: In this paper, the spectral properties of (AlxGa1-x)2O3 were investigated by Spectral Ellipsometry (SE) together with the optical transmission method, and the spectral dependence of the refractive index (n) by SE is in accordance with the reported experiment results.
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