Dong Wei
3 Papers
2 Citations
Dong Wei is an academic researcher. The author has contributed to research in topics: Shearing (physics) & Displacement (vector). The author has an hindex of 1, co-authored 3 publications.
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Papers
Patent
Optical measurement method of strain localization band strain based on rectangular subarea
Wang Xuebin,Hou Wenteng,Dong Wei,Li Shunli,Cao Siwen +4 more
- 08 Sep 2017
TL;DR: In this article, an optical measurement method of strain localization band strain based on a rectangular sub-area is proposed to measure the space-time distribution rules of the in-band strain field about the conditions that the strain localization bands is narrow and the inband strain distribution is severely uniform.
1
Patent
Unified optical measurement method for width and spacing of strain localization bands
Wang Xuebin,Hou Wenteng,Feng Weiwu,Dong Wei,Li Shunli +4 more
- 25 Jul 2017
TL;DR: In this article, a unified optical measurement method for the width and the spacing of strain localization bands is proposed, which comprises the steps of collecting the images of one surface of an object during the loading process; acquiring the displacement and the strain of each measurement point on the images; on a first image, selecting the measurement area of a strain localization band and measuring the average tilt angle of the strain localization, except the first image except the other images, determining the areas of all the other image associated with the strain localized band and containing the straining band; enabling the strained localization
1
Patent
Optical measurement method of strain localization band dilatancy angle
Wang Xuebin,Hou Wenteng,Dong Wei,Zhang Bowen +3 more
- 02 Mar 2018
TL;DR: In this paper, the authors provided an optical measurement method of a strain localization band dilatancy angle, which comprises the following steps of collecting images and acquiring a displacement and a strain of each measuring point in the images; determining areas which contain strain localization bands to be measured and are related to a measured area in the other images except for a first image except for the first image.