Apparatus and methods according to the present invention preferably utilize electroosmotic pumps that are capable of generating high pressure and flow without moving mechanical parts and the associated generation of unacceptable electrical and acoustic noise, as well as the associated reduction in reliability. These electroosmotic pumps are preferably fabricated with materials and structures that improve performance, efficiency, and reduce weight and manufacturing cost relative to presently available micropumps. These electroosmotic pumps also preferably allow for recapture of evolved gases and deposited materials, which may provide for long-term closed-loop operation. Apparatus and methods according to the present invention also allow active regulation of the temperature of the device through electrical control of the flow through the pump and can utilize multiple cooling loops to allow independent regulation of the special and temporal characteristics of the device temperature profiles. Novel microchannel structures are also described.

Electroosmotic microchannel cooling system

A probe card assembly includes a probe card, a space transformer having resilient contact structures (probe elements) mounted directly to (i.e., without the need for additional connecting wires or the like) and extending from terminals on a surface thereof, and an interposer disposed between the space transformer and the probe card. The space transformer and interposer are “stacked up” so that the orientation of the space transformer, hence the orientation of the tips of the probe elements, can be adjusted without changing the orientation of the probe card. Suitable mechanisms for adjusting the orientation of the space transformer, and for determining what adjustments to make, are disclosed. The interposer has resilient contact structures extending from both the top and bottom surfaces thereof, and ensures that electrical connections are maintained between the space transformer and the probe card throughout the space transformer's range of adjustment, by virtue of the interposer's inherent compliance. Multiple die sites on a semiconductor wafer are readily probed using the disclosed techniques, and the probe elements can be arranged to optimize probing of an entire wafer. Composite interconnection elements having a relatively soft core overcoated by a relatively hard shell, as the resilient contact structures are described.

Probe card assembly and kit, and methods of making same

This relates to the manner in which computers are configured in a given area in order to conserve space and to deal with cooling issues associated with the close housing of a large number of computers. Efficient arrangements for efficiently increasing the density of computer configurations are shown, particularly when used in a network server or host environment.

High density computer equipment storage system

The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an compliant or high modulus elastomeric material. A standard packaging substrate, such as a ceramic integrated circuit chip packaging substrate is used to provide a space transformer. Wires are bonded to an array of contact pads on the surface of the space transformer. The space transformer formed from a multilayer integrated circuit chip packaging substrate. The wires are as dense as the contact location array. A mold is disposed surrounding the array of outwardly projecting wires. A liquid elastomer is disposed in the mold to fill the spaces between the wires. The elastomer is cured and the mold is removed, leaving an array of wires disposed in the elastomer and in electrical contact with the space transformer The space transformer can have an array of pins which are on the opposite surface of the space transformer opposite to that on which the elongated conductors are bonded. The pins are inserted into a socket on a second space transformer, such as a printed circuit board to form a probe assembly. Alternatively, an interposer electrical connector can be disposed between the first and second space transformer.

High density integrated circuit apparatus, test probe and methods of use thereof

A semiconductor device handler with a temperature controlled test area. Temperature control is provided in part through the use of temperature controlled air forced across the test area. For heating the test area, electrical resistance heaters are uniformly distributed through the test area and are controlled to provide the desired temperature. The handler has a close pitch between adjacent sockets such that it is not possible to distribute refrigeration elements over the test area. Instead, a refrigeration element is placed on one side of the test area. To prevent formation of an undesirable temperature gradient, heat is injected at a specific location in the test area.

Method and apparatus for temperature control of a semiconductor electrical-test contractor assembly

A liquid cooled heat sink for electronic circuit boards is described. A heat sink base includes a liquid cooling arrangement to remove heat from the base. An arrangement of cooling fins extends from the base, and at least one surface of each fin includes a thermal interface layer. The arrangement is adapted so that the fins fit between parallel electronic circuit boards such that for each circuit board, a thermal contact layer of a fin contacts multiple components on the circuit board so as to conduct heat from the components into the fin, which in turn transfers heat to the heat sink base.

Liquid DIMM Cooler

A method and apparatus for testing integrated circuit devices includes a cooling chuck which is extensible within a bore in a cooling chuck body to a position in thermal contact with the integrated circuit device. The temperature of the cooling chuck is regulated by a fluid cooling system, which can be set to operate at a selected capacity to maintain the integrated circuit device at a desired temperature during testing.

Method and apparatus for cooling an integrated circuit chip during testing

A circuit board module for a supercomputer includes quick connections for power, ground, coolant quick connects, and circuit quick connects. The quick connections provide for insertion of modules with substantial savings in time and effort. The electrical power and ground connections and the liquid coolant connections engage and disengage automatically upon insertion and removal of the modules. The circuit quick connects require only insertion of a camming tool for connection and disconnection. The modules require no bolting or unbolting of clamps or hoses for the various connections.

Quick disconnect system for circuit board modules

A rack including a rail for supporting a computer module and a grounding element electrically coupled to the rack and positioned to electrically contact a computer module inserted in the rack such that the grounding element provides a path to ground. The grounding element can be an arcuate bracket attached to the rail to make contact with a side of the computer module. The grounding element can be a conductor extending from the rack and positioned to make contact with a side of the computer module. The rack can include a wider section which provides a cabling channel and a member on the rack for mechanically coupling the rack to an adjacent rack. The rack can include at least one passage for allowing a cable to pass through the rack to an adjacent rack and a cable organizer for maintaining placement of at least one cable routed through the passage.

Computer module mounting system and method

A method and apparatus for real-time testing of a Tape Automated Bonded integrated circuit is described. The apparatus is inserted between a test board and a TAB tape integrated circuit. The beams of the assembly are arranged in a pattern similar to the pattern of the electrical contact pads on the test board and the TAB tape. When axial pressure is applied to the test board, the apparatus and the TAB tape, the beams compress and deform, thereby providing a scrubbing contact between the ends of the beams and the contact pads of the TAB tape and the test board. The beams are short in length thereby providing an electrical connection of virtually no impedance interface between the TAB tape and the test board, thereby allowing the intergrated circuit to be tested at AC speed.

Dual contact beam assembly for an IC test fixture

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