Bing Zhou
Taiyuan University of Technology
82 Papers
142 Citations
Bing Zhou is an academic researcher from Taiyuan University of Technology. The author has contributed to research in topics: Microstructure & Diamond. The author has an hindex of 10, co-authored 55 publications. Previous affiliations of Bing Zhou include Nanjing University of Science and Technology & Francisk Skorina Gomel State University.
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Papers
Preparation and characterization of TiO2 thin film by thermal oxidation of sputtered Ti film
TL;DR: In this article, the structure, composition, morphology and optical properties of oxidized titanium dioxide thin films were characterized by Raman spectroscopy, X-ray diffraction, Xray photoelectron spectrograph, atomic force microscopy and UV-visible spectrograms.
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Study of effect annealing temperature on the structure, morphology and photocatalytic activity of Si doped TiO2 thin films deposited by electron beam evaporation
TL;DR: In this paper, the structure and morphology of transparent Si-doped TiO2 thin films (Si-TiO2) were analyzed by X-ray diffraction, Raman microscopy, XPS and atomic force microscopy.
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Microwave plasma reactor with conical-reflector for diamond deposition
TL;DR: In this article, a microwave plasma chemical vapor deposition (MPCVD) reactor with a conical-reflector cavity is presented, where a mobilizable conical reflector cavity, cylindrical reflector and mobilizable substrate are used to tune the system.
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Effects of oxygen/argon ratio and annealing on structural and optical properties of ZnO thin films
TL;DR: In this paper, the structural and optical properties of ZnO thin films were investigated in dependence of O2/Ar ratio and annealing temperature by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), Raman scattering spectrography, UV visible spectrograms, and photoluminescence (PL) spectrogram.
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Structure and optical properties of Cu-DLC composite films deposited by cathode arc with double-excitation source
Bing Zhou,Zhubo Liu,D.G. Piliptsou,Shengwang Yu,Wang Zhifeng,A.V. Rogachev,A.S. Rudenkov,Aliaksei Balmakou +7 more
TL;DR: In this article, the microstructure, composition, morphology, hardness and optical properties of the films were studied by Raman, XPS, AFM and SEM, UV-Vis, laser ellipsometer and Vickers sclerometer.
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