Trap (computing)

Abstract: Equations are presented that permit the calculation of the isothermal current- (I) vs-time ($t$) characteristics for defect insulators and semiconductors in which the field is sufficiently high and the active region sufficiently thin so that recombination of free carriers is negligible. More important, however, it is shown that by plotting $\mathrm{It}$ vs ${log}_{10}t$ the resulting characteristic is either (a) in the case of distributed traps, a direct image of the trap distribution, or (b) in the case of discrete traps, exhibits a number of sharp maxima at various times, depending on the trap parameters. The technique permits the direct determination of the trap distribution without having to have an a priori knowledge of the trap parameters and without the necessity of laborious analyses.

Abstract: An angioplasty device and particle trap for use in removal of a particle from a small diameter vessel or vessel-like structure is disclosed. One embodiment includes a catheter for insertion into a vessel-like structure, the catheter having a catheter wall and a movable member, a trap operably connected to the catheter wall and to the movable member, wherein relative motion between the catheter wall and the movable member actuates the trap. In one embodiment, the expanded trap is formed from struts in a spiral-shaped configuration. In one embodiment, the contracted trap forms a waist to creates a pinch-point to trap particles. In one embodiment, the contracted trap forms a cocoon-like structure to further trap particles. In one embodiment, the angioplasty device includes a handle to actuate the trap from a contracted position to an expanded position and return to a contracted position. The handle provides rotational or longitudinal or both types of movement to actuate the trap.