TL;DR: A new approach to testing that uses combinatorial designs to generate tests that cover the pairwise, triple, or n-way combinations of a system's test parameters, and is implemented in the AETG system.
Abstract: This paper describes a new approach to testing that uses combinatorial designs to generate tests that cover the pairwise, triple, or n-way combinations of a system's test parameters. These are the parameters that determine the system's test scenarios. Examples are system configuration parameters, user inputs and other external events. We implemented this new method in the AETG system. The AETG system uses new combinatorial algorithms to generate test sets that cover all valid n-way parameter combinations. The size of an AETG test set grows logarithmically in the number of test parameters. This allows testers to define test models with dozens of parameters. The AETG system is used in a variety of applications for unit, system, and interoperability testing. It has generated both high-level test plans and detailed test cases. In several applications, it greatly reduced the cost of test plan development.
TL;DR: The author's retest strategy consists of two major phases (the test classification phase and test plan update phase), which involves the use of the test plan in a way that will reduce the amount of testing required.
Abstract: A problem facing those conducting maintenance testing is to identify proper test classes. The notion of regression testability is introduced as a way to measure the ease of retesting. Both the program design and the test plan design may affect the regression testability of a program. The testing set, testing number, regression number and stable and workable metrics are developed to measure the program and the test plan and program testability is defined. The retest strategy is proposed for performing corrective regression testing. This approach involves the use of the test plan in a way that will reduce the amount of testing required. The guiding principle of the retest strategy is to view the regression testing problem as being composed of two subproblems (the test selection problem and the test plan update problem). To this end, the author's retest strategy consists of two major phases (the test classification phase and test plan update phase). >
TL;DR: In this article, security assessment and vulnerability testing of software applications is performed based at least in part on application metadata in order to determine an appropriate assurance level and associated test plan that includes multiple types of analysis.
Abstract: Security assessment and vulnerability testing of software applications is performed based at least in part on application metadata in order to determine an appropriate assurance level and associated test plan that includes multiple types of analysis. Steps from each test are combined into a 'custom' or 'application-specific' workflow, and the results of each test may then be correlated with other results to identify potential vulnerabilities and/or faults.
TL;DR: In this article, the authors compare test plans for the Weibull and lognormal distributions with some compromise test plans with respect to additional criteria including the ability to detect departures from the assumed stress-life relationship and the robustness of the assumptions used in determining the test plans.
Abstract: Previous work on planning accelerated life test plans for the Weibull and lognormal distributions has concentrated on optimum test plans that minimize the variance of some specified estimator. However, these test plans use tests at only two levels of stress and, thus, have serious practical limitations. This article compares optimum test plans and some compromise test plans with respect to additional criteria including (a) the ability to detect departures from the assumed stress-life relationship and (b) robustness to departures from the assumptions used in determining the plans. The comparisons are based on the large sample properties of maximum likelihood estimators, and the test plans are compared over a range of practical testing situations. The comparisons suggest some general rules for planning accelerated life tests.
TL;DR: This paper presents an overview of reliability testing, reliability estimation, and prediction models and approaches for the design of test plans which result in providing failure data and/or degradation data in a limited test duration.
Abstract: This paper presents an overview of reliability testing, reliability estimation, and prediction models. It also presents approaches for the design of test plans which result in providing failure data and/or degradation data in a limited test duration. Equivalence of different test plans which result in similar reliability estimates is also discussed. Use of degradation data for reliability estimates and maintenance decisions are presented.