Scanner

Abstract: A new mechanical scanner design for a high-speed atomic force microscope (AFM) is presented and discussed in terms of modeling and control. The positioning range of this scanner is 13 mum in the X- and Y-directions and 4.3 mum in the vertical direction. The lowest resonance frequency of this scanner is above 22 kHz. This paper is focused on the vertical direction of the scanner, being the crucial axis of motion with the highest precision and bandwidth requirements for gentle imaging with the AFM. A second- and a fourth-order mathematical model of the scanner are derived that allow new insights into important design parameters. Proportional-integral (Pl)-feedback control of the high-speed scanner is discussed and the performance of the new AFM is demonstrated by imaging a calibration grating and a biological sample at 8 frames/s.

Abstract: A terrestrial laser scanner measures the distance to an object surface with a precision in the order of millimeters. The quality of the individual points in a point cloud, although directly affecting standard processing steps like point cloud registration and segmentation, is still not well understood. The quality of a scan point is influenced by four major factors: instrument mechanism, atmospheric conditions, object surface properties and scan geometry. In this paper, the influence of the scan geometry on the individual point precision or local measurement noise is considered. The local scan geometry depends on the distance and the orientation of the scanned surface, relative to the position of the scanner. The local scan geometry is parameterized by two main parameters, the range, i.e. the distance from the object to the scanner and the incidence angle, i.e. the angle between incoming laser beam and the local surface normal. In this paper, it is shown that by studying the influence of the local scan geometry on the signal to noise ratio, the dependence of the measurement noise on range and incidence angle can be successfully modeled if planar surfaces are observed. The implications of this model is demonstrated further by comparing two point clouds of a small room, obtained from two different scanner positions: a center position and a corner position. The influence of incidence angle on the noise level is quantified on scans of this room, and by moving the scanner by 2 m, it is reduced by 20%. The improvement of the standard deviation is significant, going from 3.23 to 2.55 mm. It is possible to optimize measurement setups in such a way that the measurement noise due to bad scanning geometry is minimized and therefore contribute to a more efficient acquisition of point clouds of better quality.

Abstract: This method and apparatus optically samples numerous points on the surface of an object to remotely sense its shape utilizing two stages. The first stage employs a moveable non-contact scanner (12), which in normal operation sweeps a narrow beam of light (42) across the object (38), illuminating a single point (36) of the object (38) at any given instant in time. The location of that point relative to the scanner is sensed by multiple linear photodetector arrays behind lenses (16, 18) in the scanner. These sense the location by measuring the relative angular parallax of the point. The second stage employs multiple fixed but widely separated photoelectronic sensors (26, 28, 30), similar to those in the scanner, to detect the locations of several light sources (20, 22, 24) affixed to the scanner, thereby defining the absolute spatial positions and orientations of the scanner. Individual light sources are distinguished by time-multiplexing their on-off states. A coordinate computer (34) calculates the absolute spatial positions where the scanner light beam is incident on the object at a given instant and continuously on a real time basis to generate a computer model of the object.

Abstract: A method of selectively generating one or more scan lines from a multi-scan line scanner involves measuring the pulse widths of the pulses in a signal output of a motor driving the polygon mirror of the scanner wherein the signal relates to the position of the polygon's mirror facets. By measuring and distinguishing each of the pulses in the signal, the illumination of the scan beam can be synchronized with the rotation of the polygon mirror to only generate a desired number of scan line patterns that is less than the full complement of the scan line patterns capable of being generated by the multi-scan line scanner.