Abstract: An apparatus and a relative method which permit carrying out a complete cycle of functional tests and parametric measurements on EPROM type semiconductor devices during their permanence inside a burn-in chamber, thus greatly reducing the time necessary for testing and classifying the devices, besides ensuring a higher reliability The system utilizes special "intelligent" cards, ie, provided with a card microprocessor which may be connected to a supervisory system's CPU directing the test and classification process of the devices

Abstract: In order to manipulate semiconductor wafers with high functional reliability, a tactile sensor based wafer handling apparatus designed to attach to a commercially available industrial robotic arm is herein described. The apparatus has three rod-like projections called fingers, one finger of which is extendable, the other which are fixed. All fingers are instrumented with strain gauge sensors in order to allow the monitoring of all forces applied to the fingers during wafer handling operations. All sensors provide proportional data. The wafer handling apparatus enables a monitoring computer to direct the motions of a satisfactorily equipped robot arm to operate in the following modes of operation. Force controlled grasping of the wafer can be provided to insure adequate grasp for transport and to limit forces exerted on the wafer. Force monitoring while releasing a wafer can be provided to insure safe hand off to another device or surface thus minimizing the likelihood of dropping a wafer. Proportional adaptive control of robot motions necessary can be provided to align wafers extremely closely to process carrier surfaces. Proportional adaptive control of robot motions necessary to guide the gripping apparatus can be provided for balanced contact with the edge of a wafer. Force monitoring can be provided for the purpose of detecting collisions with object or humans during transport of a wafer.

Abstract: An optical modulation device for effecting optical modulation by controlling the diffraction phenomenon of light, which not only consumes a small amouhnt of the driving energy employed, such as a electric power, but which is also capable of improvements in reliability

Abstract: Numerous papers have discussed the behavior of flip-flops in synchrronization and arbitration circuits. Here, a nonconventional machine, which avoids completely synchronization failures by using metastability detectors in conjunction with a stretchable clock, is evaluated. The core of the paper focuses on the quantitative evaluation of the performance and reliability of this unconventional kind of machine. Only synchronization and arbitration failures are considered here, so when these machines are compared to conventional ones, all other factors affecting reliability and performance (e.g., technology, fabrication, etc.) are kept invariant. The MTBF's and a new normalized throughput measure show they can run substantially faster and more reliably than functionally equivalent, conventional machines with fixed clocks. Integrrated circuit implementations have been built and successfully tested.

Abstract: A safety air bag in/on the steering wheels of motor vehicles, which is combined with a solids/gas generator to form a premountable assembly, also contains the sensors which are needed for actuation and an energy storage device. This means that a motor vehicle can also be retrofitted with an air bag, which can also be replaced and is distinguished by the high level of safety and reliability it offers owing to the elimination of electric lines passing through the steering column.

Abstract: A protection system has been developed for power transistors that allows use of their full capabilities as manufactured, rather than those established by a hypothetical safe-area curve. As a result, higher power ratings can be guaranteed with a given die size. At the same time, reliability is improved by controlling peak temperature and by permitting individual devices to be 100% tested for rated power.

Abstract: The injection of dry alkaline compounds into the furnace or post-furnace regions of utility boilers to reduce SO2 is currently under development as a lower cost option to conventional flue gas desulfurization technology. Part I of this paper focused on the science and process development of the various dry sorbent technologies. Part II will address applications of these technologies, including SO2 removals in full-scale boilers, methodologies for designing sorbent injection systems, power plant impacts, process integration issues, and cost. Because the dry technologies use the furnace and/or ducts as the chemical contactor, potential impacts on power plant operation and reliability are as critical in assessing the commercial applicability of each technology as SO2 removal and sorbent utilization. Consequently, the technical and economic feasibility of the various dry processes is highly site specific.

Abstract: A study of the performance and hot-electron reliability of submicron n-channel MOSFET's is presented. Well-established hot-electron-based physical models are adequate in explaining the general behaviors of the drain, substrate, and gate currents of these devices. These results suggest that the basic physics is rather well-understood and the design criteria developed for micron-size devices can be extended to cover their deep-submicron counterparts. Hot-electron studies reveal a channel-length dependence in device degradation. This phenomenon together with gate-induced drain leakage current [1] will impose an upper limit on the supply voltage and a lower limit on the gate oxide thickness. Based on device degradation results alone, the power supply voltage for a quarter-micron device with oxide thickness of 86 A should be limited to 2.5 V if no degradation-resistant structure is used.

Abstract: New designs of short- and long-wavelength semiconductor diode lasers aim to increase spatial-mode stability and to boost reliable output power. In the short-wavelength region, AlGaAs/GaAs devices grown by MOCVD or MBE show the most promise. Long-wavelength InGaAsP/InP devices grown by LPE have demonstrated 100-mW reliable power, and improvements in device yield and performance are expected through the use of VPE or MOCVD.

Abstract: New-generation mainframe computer complexes serving time-critical industrial and commercial users have introduced new problems for facilities engineers. Harmonic currents induced by switching computer power supplies badly distort the output waveform of high-impedance power sources. The resultant source current output will typically be out of required tolerance and can directly relate to unwanted voltage drops, data inaccuracies, and impaired load reliability. Conventional uninterruptible power supply systems offer load voltage continuity but suffer a trade-off in extremely high impedance compared to utility. This trade-off may no longer be well tolerated. A new UPS technology that demonstrates dramatically lower input-to-output impedance than was possible formerly will be evaluated. The system is based primarily on a unique rotating device employing a common stator for both motor and generator functions. Data will be presented on system reliability, efficiency, load isolation, and current-voltage dynamics.

Abstract: In a multicomputing system, in particular for safety devices in motor vehicles, for example air bags or safety-belt tensioners, it is necessary among other things to generate a power-on reset when the working voltage is switched on, an undervoltage reset when the working voltage falls below a predetermined value and a monitoring reset in case of faulty computations. These three requirements are met by a single driving circuit common to all computers of the multicomputing system and having a comparator, OR-means and switching transistors. By using a single common driving circuit, the multicomputing system can be built in a minimal space and its reliability is increased.

Abstract: Operations of parallel-connected Triport UPS systems are discussed. The parallel operation becomes important (1) for increasing the rated kVA of the system and (2) for realizing a redundant system to improve the system reliability. We first consider the typical parallel operation of two Triports under the normal mode and analyze the current balance conditions which make the ratio of output currents equal to that of the kVA ratings. Discussions are then extended to the parallel system of n (≥2) Triports. Experimental results are shown of the current sharing characteristics at steady state and so forth.

Abstract: Developers of biosensors as medical devices are using emerging technologies that incorporate chemical assays with fiber optics and semiconductors. These biosensors will eventually become indwelling catheters for monitoring blood analyte concentrations as well as functioning as controlled feedback elements for artificial organs. Materials used in these devices are subject to problems of manufacture and reliability as well as those induced by the human body's response to these “foreign agents.” The Division of Mechanics and Materials Science in the Center for Devices and Radiological Health at the Food and Drug Administration has initiated a program to investigate factors that effect sensitivity, selectivity and reliability of sensors used in biological applications. Our group's principle focus is on sensors of chemical processes. This article is an outgrowth of our research efforts and is a review of some of the technologies that are currently available or becoming available for these applications. The goal of our research is to identify factors that will have an impact on the reliability of long‐term implanted medical devices with particular attention to sensors used in feedback‐controlled therapeutic systems.

Abstract: PURPOSE:To improve the reliability of a reactive power compensating device by duplicating a voltage/reactive power detecting circuit, a voltage/reactive power control circuit and a phase control circuit to detect accurately an abnormal system and attaining the control with normal systems only. CONSTITUTION:A controller 6 for compensation of reactive power consists of a voltage/reactive power detecting circuit 7, a voltage/reactive power control circuit 8, a phase control circuit 9 and a fault detecting circuit 10. Then the circuits 7, 8 and 9 are duplicated. The circuit 7 detects the system voltage of a primary circuit 1 in a system and the reactive power flowing into a reactor 2 and delivers these voltage and power to the circuit 8. The circuit 8 calculates a prescribed control amount from said system voltage and reactive power and delivers it to the circuit 9. The circuit 9 delivers an ignition signal to a gate controller 11 and at the same time supplies the output signal of the circuit 9 and the self-diagnosis results of circuits 7 and 8 of each system to the circuit 10. Thus only the nondefective systems are used according to the result of detection of the circuit 10. Thus the reliability is improved for a reactive power compensating device for electric power system.

Abstract: To determine the "real life" validity of the State form (experimental B-1 and final X-1) of the State-Trait Anxiety Inventory, two P-technique analysis studies were carried out. The first utilized two therapists and two of their respective clients. The second involved two patients on an alcoholic treatment unit and their therapists. Expected relations in the first study between clients' responses to the STAI B-1, a separate Daily Diary, and therapists' judgments were not entirely forthcoming. However, the second study showed expected correlations between measures of psychophysiological functions, psychological tests, and the clinicians' judgement. Several reliability indices applied to the Trait form (B-2 and X-2) showed considerable relation between two administrations two months and one month apart respectively.

Abstract: The utility model discloses a multi-purpose automatic water-level control device which is composed of an electrode water gage, an alternating current contactor, an intermediate relay and a converting switch. The utility model has the advantages of broad sphere of application, simplicity, safety, high reliability, convenient maintenance and easy manufacturing, and is a control device with practicability.

Abstract: The following general requirements are made in the visual inspection of the semiconductor wafer: (1) the candidates for the defect should automatically be detected from a complex multivalued pattern; and (2) only serious defects to the reliability of the element are extracted from those candidates. Such sophisticated decisions must be made with a high reliability and a high speed. This paper proposes a method for detecting serious defects as a means to cope with those requirements. The method is composed of the following two steps.

Abstract: It is intended to specify a method and a device for testing the reliability of an energised switching operation, it being intended to carry out the testing for conformity with predetermined conditions quickly, with high accuracy and good operational reliability (high operational safety). This object is achieved in that two mutually independent enable signals F1 and F2, which are formed using different methods, are linked to form a switching enable, one of the enable signals also being sufficient for reversionary operation in the event of a defect. The required accuracy is achieved by means of a digitised method, and a high operating speed by rapid recognition of a tendency towards increasing or decreasing correspondence with the specified conditions. Such methods and devices are used in automatic changeover apparatuses for switching over incoming feeders to busbars of switching installations.

Abstract: Semiconductor power losses are dissipated in the form of heat, which must be transferred away from the switching junction. The reliability and life expectancy of any power semiconductor are directly related to the maximum device junction temperature experienced. It is therefore essential that the thermal design determines accurately the maximum junction temperature from the device power dissipation.

Abstract: This presentation will discuss the numerous significant advances which have been made in photovoltaic concentrator development in the past 18 months. These advances have important performance, cost and reliability implications for concentrator technology in both the near-term and the more distant future. The advances include: development of Si concentrator cells with efficiencies of 28% at Stanford and 25% at the University of New South Wales; development of better and more cost-effective Fresnel lenses, cell assemblies, and trackers and controllers; and use of 1-sun Si cells in low concentration designs. With these advances and continued development, PV concentrator module prices of $1 per peak watt can probably be achieved within several years. Thus, PV concentrators represent a very attractive collector option for large PV power systems in the near future.

Abstract: Wafer level reliability testing has been nurtured in the DARPA supported workshops, held each autumn since 1982. The seeds planted in 1982 have produced an active crop of very large scale integration manufacturers applying wafer level reliability test methods. Computer Aided Reliability (CAR) is a new seed being nurtured. Users are now being awakened by the huge economic value of the wafer reliability testing technology.

Abstract: The MMIC (Monolithic Microwave Integrated Circuit) has great potential in constructing microwave equipment due to its light weight, small size, and high reliability. It is now stepping into practical application in various communications equipment. This paper presents recent research and development activities for GaAs MMICs in Japan.

Abstract: Microstructural and strength data are presented wnich reveal the types and severity of processing defects encountered using the injection molding and sintering approach to silicon nitride shape fabrication for heat-engine applications A simple theoretical analysis of these data has highlighted the importance of taking a broad approach to the reliability enhancement of structural ceramics via strength, Weibull modulus, and toughness improvement The greatest potential for reliability enhancement lies in increased Weibull modulus through process improvement and control It is noted that NDE has excellent potential for ensuring that heat-engine components meet reliability specifications 26 references

Abstract: Electric power companies are looking for ways and means to overcome the problems caused by the rapid increase of construction costs of a new power plant. One of the current alternatives is to share a generating plant among two or more utilities. In the paper, a probabilistic model of a jointly owned generating unit is developed. The model is utilised to investigate the effects of joint ownership of generation on the reliability as well as on the production costs of two interconnected systems. The segmentation method is used in the numerical evaluation.