Abstract: PURPOSE:To improve the versatility of working data about a work to provide high reliability working process in a production line by employing a data control system in a production process of automobile engines for example. CONSTITUTION:In a production line L conveying cylinder blocks W of automobile engines mounted on pallets P through a conveyer 1, a magnetic card M in which working data of the cylinder block W are recorded is attached to the pallet P, and a corresponding data writing and/or reading unit R for writing working data or assembling data in the card M or reading same from the card M in each working process is arranged in said each process. By this constitution, the versatility of working data for works in the production line is improved and high reliability working process is provided.

Abstract: This series of papers addresses, for the first time, the economic, thermal, voltage, and reliability considerations of utility load management on the distribution system, it also quantifies the changes in performance of the customers' controlled electric energy conversion devices and relative economics.

Abstract: An improvement to a laser ceilometer and like instruments comprises a laser diode array which includes a plurality of laser diodes, and an array driver driving the laser diode array in accordance with commands from a microprocessor. The laser diodes are GaAs diodes. By utilizing the improvement, service life and reliability of the ceilometer are both increased.

Abstract: In this paper we present a new general stochastic model for the reliability dynamics of large scale interconnected power systems. We show that this model can be used for optimum operation and management of any power pool. This is illustrated by a flow diagram showing how an on-line computer determines the optimum power dispatch policy for maximum reliability. For convenience (of users) this is also presented in the form of an algorithm. In order to illustrate the model and the proposed algorithm, a simple example of a power pool, consisting of three interconnected utilities, is considered and the effect of the proposed control scheme on the reliability of the entire system is discussed. The general model can also be used for economic dispatch and generation expansion planning.

Abstract: PURPOSE:To reduce the number of parts of a panel logic circuit part and to hold the reliability and to reduce the mounting space, by executing a microprogram routine for maintenance or diagnosis in a control storage by an operation processing device. CONSTITUTION:Commands for maintenance or diagnosis from panel command and panel data switches 103 and 104 of a maintenance panel operation and display part 1 are received by panel command and data registers 204 and 205 of a panel logic circuit part 2, and contents of registers 204 and 205 are selected by a panel data selector 206 and are applied to an operation processing device 3. The output of a timing controlling circuit 203 for the panel logic circuit part is applied to a timing controlling circuit 303, and the output of a control storage address generating circuit 202 for maintenance and diagnosis is applied to a control storage address selector 302. A program routine for maintenance or diagnosis in the logic circuit part 2 is executed in the device 3, thus reducing the number of parts of the circuit part 2 to improve the reliability.

Abstract: PURPOSE:To enable the measurement of current flowing through a specific closed circuit without lowering of quality and reliability with a simple construction by forming an opening at a part surrounded by a closed circuit pattern whose current of a printed circuit board is to be measured. CONSTITUTION:An opening 2 is formed at a part surrounded by a closed circuit pattern 3 whose current is to be measured. As current flows to the closed circuit pattern 3, a cross magnetic field is generated. Therefore, a probe 4 of an ammeter is so arranged to be fitted detachably into the opening 2 from above or below the end rim of a printed circuit board 1 with a function of measuring a cross magnetic field to be converted into current. The probe 4 is fitted into the opening 2 to run current to the closed circuit pattern 3 enabling extremely easy measurement of current.

Abstract: 16 : A semiconductor device comprising one or more cold cathodes is mounted by means of a weld on a support of a ceramic material so that areas at which emission occurs are situated opposite the openings in the support. Such a construction has various advantages. If the support is the end wall of a vacuum tube, the semiconductor body can be cooled in a simple manner, while moreover semiconductor zones can be connected directly. This results in a saving of lead-through pins in the vacuum tube, which especially in the case of several emission points increases the reliability of the vacuum. Another advantage consists in that the cathodes can be connected through the weld to a common connection on the support, which results in that the various emission points are applied to substantially the same surface potential, so that also the electron-optical behaviour is uniform for electrons which are generated at various emission areas.

Abstract: The reliability of n-channel and p-channel MOSTs in CMOS (complementary MOS) integrated circuits is investigated applying bias—temperature aging test. It is evidenced that negative bias—temperature aging causes p-channel MOST threshold voltage increase and n-channel MOST threshold voltage decrease, while positive bias—temperature aging causes p-channel MOST threshold voltage decrease and n-channel MOST threshold voltage increase. The causes of the observed threshold voltage instabilities are probably electron injection into the gate oxide for positive bias—temperature aging and hole and Si-ion injection for negative bias—temperature aging. Bias—temperature aging test also results in 16.6% of investigated MOSTs to failure suddenly that being the consequence of gate/p+—drain (5%), gate/n−—substrate (2.5%), and gate/p-well (5.8%) shorts and gate opens (3.3%). [Russian Text Ignored]

Abstract: The problem of false alarms is defined showing the demanding nature of the application. Detector dependencies are discussed relative to reliability, such as: pyroelectric material, possible depolarization, long term stability, use of separate load resistors to achieve predictable time constants, response to temperature changes, soft error rate, potential microphonics, and the need for EMI protection. Highest reliability of the circuit design involves consideration of the internal FET of the detector as well as careful selection of coupling capacitors, resistors and the power supply. The detector signal's dependence on optical design is identified and the relationship of signal-to-noise specified. User handling precautions of the detector are also given. Appendices show 1) the relationship of S/N ratio to false alarm rate in Gaussian terms, 2) failure rates of alarm components, 3) evaluation of approaches to testing, and 4) a brief discussion of soft error mechanisms.© (1983) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Abstract: PURPOSE:To quickly and satisfactorily realize line junction by detecting the timing where deformation of Au ball stops and junction strength is saturated as the timing where the downward movement of capillary chip stops and by shifting upward the capillary chip. CONSTITUTION:The distance h is measured by reflecting the light emitted from the sensor 10 by the plate 9 and its output signal is judged 19. When dh/dt is zero, an output is applied to the control circuit 14. The control circuit 14 immediately drives the motor 12 in order to move upward the capillary chip 1. According to this structure, when junction strength is saturated, the capillary chip 1 simultaneously moves upward. Therefore, the junction time can be saved and reliability of junction can also be ensured.

Abstract: Practical approaches to improved reliability have been made difficult to develop at least in part because reliability is an interdisciplinary art involving solid-state physics, circuit theory, and information engineering. In this paper, I delineate some of the factors that must be considered in improving reliability at the design stage. A major factor in achieving this result is the demonstration that the levels of power dissipation in discrete active devices can be reduced by up to at least a factor of 10, with actual improvement in overall circuit operation. The key to this improvement is the fact that with most active devices, the characteristics displayed in a circuit are very sensitive to output current level, but much less sensitive to output supply voltages as long as they exceed a minimum value. As supply voltages are reduced, the power dissipated decreases proportionately, but operating characteristics need not be changed. A series of ``paper'' designs can quickly verify the independence of operating conditions with respect to the output supply voltage. The result is less waste power, less cooling requirement, and, because of the sensitivity of MTBF (mean time between failure) to device temperature, increased overall MTBF, allowing systems to approach their life expectancy more closely. The subject of electron tube circuit reliability is also included in the discussion, first because the same principles that apply to bipolar and field-effect transistors apply to electron tubes as well, and because high-power transmitters still must use electron tubes in their final stages.

Abstract: Phase-change water heating systems have emerged as one of the solar industries most promising technologies. These systems have greater reliability, foolproof freeze protection, automatic high-temperature humidity, higher efficiency, and no threat from a failed pump or controller.

Abstract: Recent improvements in thermoelectric (TE) materials have led to higher figures of merit and renewed interest in a number of possible applications. This study examines the feasibility of a solar-driven TE heat pump for residential heating and cooling. Such a device would have the distinct advantages of season reversal and less moving parts for greater reliability. Although the results of this study indicate that a solar-driven TE heat pump is uneconomical at the present time the concept appears to be a viable one with further improvements in TE materials.

Abstract: : This book contains data on the electrostatic discharge susceptibility (ESD) of electronic devices. Detailed susceptibility data is presented along with the ESD classification in accordance with DOD-HDBK-263 for approximately 700 microcircuits and 500 discrete semiconductor devices. A discussion of various discharge models and failure mechanisms of ESD are also presented.

Abstract: PURPOSE:To improve the reliability, by checking, at least, two logical operation circuits in parallel operation and outputting the result of operation of a logical operation circuit not generated in error. CONSTITUTION:At least, two logical operation circuits ALU1 and ALU2 are provided in a processor and they ae operated in parallel. The logical operation circuits ALU1 and ALU2 are provided with a hardware error detection means, and the hardware error display output is outputted to lines 1 and 2. An output control means 4 consists of a gate circuit means and a display circuit means 6, and the result of operation of the logical operation circuit without error is outputted based on the output of the hardware error display.

Abstract: After a brief exposition of typical functions the implication of requirements such as expandability, reliability and versatility on hardware configuration and program structure are explained Results of analysis and tests of time-critical functions are presented Finally some aspects of interfaces to different instruments and devices are described

Abstract: PURPOSE:To enable evaluation of cracks in a humidity resistant protective film without opening a semiconductor device while reducing the humidity resistance testing tie by performing tests combined in a specified order with a thermal stress testing section and a humidity resistance testing section properly integrated. CONSTITUTION:In a reliability measuring apparatus 1, a thermal stress testing section 2 and a humidity resistance testing section 3 are integrated on the sides of a loader 4 and an unloader 5 and the reliability of a semiconductor is measured in the order of the testing section 2 to which a heat cycle is initially applied and the testing section 3. Therefore, a thermal stress concentration during the testing at the testing section 2 causes a crack in a protective film formed on the surface of an element for a higher humidity resistance. Thereafter, deficiency of characteristic will be caused by a short-time humidity resistance testing. This can reduce the humidity resistance testing time while enabling the evaluation of the conditions of cracks in the protective film without opening the semiconductor device from the results thereby assuring a high performance measurement of the reliability.

Abstract: PURPOSE:To improve the reliability and the life performance by reducing the frequency of useless operation of a timer by allowing the timer to operate once in two or three times and making a contact circuit into contactless circuit. CONSTITUTION:In a control circuit in which a timer T operates once in two or three times, the set time of an electronic timer T is obtained by adjusting a rheostat VR. In the timer T, even if the set time is elapsed, a trigger continues to output the signal at H level from its output terminal, so far as the input is at L level. Therefore, when a transistor Tr is energized through conduction, also the secondary-side coils are energized through electromagnetic induction, and the trigger feeds signals to the gates of the triacs SCR1 and SCR2 of a main circuit through the secondary-side coils OX1-OX2 and OX3-OX4. Thus, the timer T is operated once in two times, and the starting frequency is kept low.

Abstract: Computers from large mainframes to thumbnail sized microprocessors have had a dramatic impact on modern technology. This fact is particularly true in the nuclear industry where the need for safety and reliability are critical. Although the development of nuclear power began before the widespread availability of electronic computers, it is obvious that the sophisticated designs and control techniques now available would not be possible without high speed computers.

Abstract: In this paper we propose an analytical model able to describe long-term performances of a photovoltaic system. Such a model relates efficiency of the system with the more meaningful variables involved in the problem : system sizes and meteorological parameters. Furthermore we study the reliability of our model and the limits of its usefulness.