Abstract: The first electron bombarded semiconductor (EBS) devices have recently appeared on the market. These devices have already demonstrated that EBS has considerable promise as an important new electron device for power amplification and control. EBS devices are described with particular emphasis on power devices. The basic EBS principle, some of the analysis used in device design, general considerations in designing the various elements of the device, overall device design, semiconductor processing, and reliability considerations are discussed. Predictions of general directions for future work are made. Some historical information is also presented as well as a brief comparison with other competing power devices.

Abstract: Semiconductor-device quality and reliability are discussed in the context of the major factors producing failures, the relationship of process technology and its control to device quality and reliability, the testing procedures used to determine quality levels, and screening procedures that can be employed to segregate certain levels of device quality. Failure rates are presented for transistors and for both bipolar and MOS integrated circuits in several types of packages and for several kinds of device process technology.

Abstract: MOS LSI circuits share many of the reliability problem associated with discrete semiconductors and medium-scale integrated circuits. However, because of the added complexity, larger chip size, and higher densities of MOS LSI circuits, different approaches are needed. A close working relationship between the designer, manufacturer, and user-the reliability triangle--is needed to generate the manufacturing controls, testing methods, and reliability assessment procedures and to optimize the performance and reliability of the MOS LSI circuits. Using this approach, the MOS LSI circuit, having more functions per external connection, can provide a more reliable system than one of equal complexity, based on discrete devices or less complex integrated circuits. Specific areas of reliability such as pattern sensitivity, manufacturing controls, assembly, packaging, and electrical testing have also been discussed.

Abstract: Extensive testing of magnetic‐bubble circuits has been done where bubbles are propagated at frequencies up to 127 kHz and the long‐term retention of data examined. From tests performed on small circuits in a microscope environment, mean‐time‐to‐failure (MTTF) data have been taken. The effects on MTTF of garnet material parameters, ambient temperature, circuit design, ion‐implantation dosage, circuit defects and operating frequency have been examined. A high‐mobility material operated on a circuit modified as a result of these tests displayed near‐infinite MTTF over a temperature range of at least 28°C–80°C. Tests were also performed on large circuits in a memory‐module environment. The results of long‐term (∼1015 bubble steps) error‐free operations show that very large MTTF's are realizable in actual devices. A method for estimating reliability from these data is described and possible failure mechanisms for propagated bubbles are discussed in view of the new data.

Abstract: The Bell System initiated development of semiconductor devices for use in broad-band repeatered coaxial submarine-cable telephone systems in the early 1960's. Development of such devices has continued at varying levels of activity to this date. Now, over a decade later, more than five years of successful operational life have elapsed on the first installed system; one transatlantic system is in operation and several more of equal or greater length are in various stages of construction. Laboratory-like life validation tests have been conducted on all the devices for use in these systems, and up to seven years of history have elapsed on groups of 100 devices representative of the five varieties used in the first system. No failures have been observed either in service or in life validation tests, thereby confirming a FIT rate of better than five. Moreover, variables data for the representative samples aged for seven years indicate that the confirmed FIT rate may be extremely conservative. Silicon diodes aged below breakdown are more stable than the life-test system designed to evaluate their reliability. Silicon diodes aged in breakdown show a linear drift in leakage current which is so small that it is not detectable except with an ultrasensitive test system. Germanium transistors evaluated over this same period show that the change in current gain they exhibit will be substantially less than the goal established for them at the inception of development. Silicon transistors being developed for a new higher capacity system show promise of exceeding the stability of the more extensively evaluated germanium devices. These results have broader implications than their relevance to submarine-cable system performance since they indicate that the reliability which has long been considered to be inherent in semiconductor devices not only has been demonstrably achieved in quantitative terms but can be considered to be designable for future system applications.

Abstract: The purpose of this field study Is to provide a descriptive analysis of the rhetoric of physicians (1) as they communicate with their colleagues, and (2) as they communicate with their patients. To obtain the first objective the oral presentations made during weekly conferences by the surgeons at a major hospital were observed for ten months. The physicians' rhetorical training, experience, speech philosophy, and preparation are considered as well as the occasion of the speeches and an analysis of the audience. The speeches are evaluated according to their Invention, structure, style, and delivery. The second objective of the study, an analysis of the connunicatlon between doctors and their patients was reached by means of observations, Interviews, and questionnaires. The results of this study Indicate that the patients are willing to accept the surgeon's title as sufficient credentials to obey his directives without question. By the same reasoning, the surgeons themselves often seem to expect their colleagues to accept their judgment without asking for documentation. While the doctors are less hesitant In admitting mistakes and controversies concerning treatment to their colleagues than to their patients, they effectively reason that the patients' awareness of such problems would be detrimental to the patients' welfare. The surgeons demonstrate confidence In their own judgment before their colleagues and their patients but many of them lack the fluency and ease of manner which usually accompany such self-confidence In their formal speaking. The patients Interviewed, for the most part, were satisfied with their communication with their surgeon. Explanations for this satisfaction Included such characteristics as the doctor's "bedside manner," best Illustrated by his demonstration of concern for them as Individuals. The doctor gives verbal support to the principle that the patient has the right to know about his condition and treatment. Nevertheless, they are not always completely willing to disclose all possible information to the terminally ill, to some patients scheduled for operations, and under some circumstances, when a difference of opinion between doctors exist. The patient, on the other hand, reports a desire for all details but seems willing to wait for the surgeon to volunteer that information rather than to ask questions.

Abstract: Thin film and thick film circuits represent two important and high volume applications of gold in the electronics industry. This article reviews the techniques used in these fields by one major manufacturer to meet the requirements of high performance, small size and reliability.

Abstract: Where small numbers of highly reliable semiconductor devices are required, conventional methods of procurement are found to have deficiencies. An approach to procurement is proposed which is cost effective, accommodates new device types, and assures reliability in the individual device. Although principally applied to silicon planar transistors, the approach can be extended to other semiconductor types. A critical evaluation is made of the manufacturer and his technology. The devices obtained from each diffused wafer are grouped into separate lots. Selected tests are performed on these lots in order to discover possible failure mechanisms. Tests may involve simple electrical measurements or detailed techniques such as scanning electron microscopy and X-ray microprobe analysis. The Canadian/U.S.A. Communications Technology Satellite (CTS) program has adopted this procurement procedure.

Abstract: Currently a number of pulse and continuous-wave (CW) electron-bombarded-semiconductor (EBS) power devices are undergoing extended life test. No failures have been recorded in over 70 000 test hours on eight CW devices, and one failure occurred on a pulsed device.

Abstract: Nuclear power plants are rapidly assuming a major role in supplying the world's increasing demand for electric power. The saturated steam conditions of light-water reactors favor the use of 1500 or 1800 r/min turbines with four-pole generators which are already being built in ratings up to and even exceeding 1500 MVA. Recent developments in gas-cooled reactors give rise to an additional need for 3600 r/min turbines with large two-pole generators.

Abstract: This work evaluates the strengthening characteristics of two types of welded pipe repairs: full-encirclement split sleeves (two types examined) and the deposition of weld metal directly into a defect. The effort focussed on these two techniques because they were believed to have the greatest potential for successfully strengthening defective areas in a safe and economical manner.The repaired specimens examined in this study performed well. The report discusses the types of preparation that are necessary, provides procedures for using these techniques, and states conditions for which these repairs are most effective. Recommendations are provided for determining whether these repairs can be adequately inspected and widely used with a high degree of reliability for extended periods in operation.

Abstract: In the electrochemical power industry, substantial improvements in control reliability may be realized by extensive inplant tests of the controls under stress (notably temperature). This paper describes a series of test conditions to which first components and then finished controls are subjected. One example of resulting reliability is given.

Abstract: Solid-state array radar is of gyeat current interest because of the inherent reliability of solid-state devices and the concomitant promise for improvement in system reliability. However, no extensive reliability base has been established for solid-state devices employed under radar operating requirements. In this paper some of the important factors bearing a device reliability are treated. Accelerated life tests under RF conditions are presented for L-band power transistors. Preliminary life-test and failure-analysis data are also presented with recommendations on how the information can be used by the radar systems designer.

Abstract: Since the introduction of solid encapsulated epoxy signal transistors by General Electric in 1962, substantial improvements have been made in plastic materials and packaging techniques resulting in a homogeneous solid package for semiconductor components. These advances, reflected in an excellent performance record in consumer and industrial equipments, have led to the extended use of these devices in industrial and some military applications where high reliability is demanded.

Abstract: The paper discusses practical design considerations encountered in using digital computers for on-line control, where timing and reliability requirements are critical. Consideration is given to particularly critical control and measurement functions within substations and the most appropriate role for computer applications is identified.

Abstract: SUMMARY Normal (expected) minimal and maximal values of blood constituents from Beagle dogs of both sexes and at various ages were investigated as an aid in evaluating the health status of dogs before and after they inhaled radionuclides. Values for 21 blood serum constituents of male and female Beagles from 2 to 78 months old and of female dogs from 96 to 120 months old were determined and separated into specific age groups, and the percentile method was used to develop normal limits for each age group. Cholesterol concentration and γ-globulin percentage increased as a function of age from 11 to 78 months in female dogs only. Total serum protein concentration similarly increased in both sexes for dogs 2 to 78 months old. Serum inorganic phosphorus value decreased as a function of age in both sexes for dogs 2 to 54 months old, with the greatest change occurring between the 2nd and 30th months. Serum alkaline phosphatase ( alp ) activity was higher in 2- to 3-month-old male and female dogs and in 96- to 120-month-old female dogs than in 11- to 14-month-old male and female dogs. A large segment of the total population variability was attributed to “within-animal” variability. Albumin values determined by electrophoresis and by a semiautomated analyzer were compared, and a ratio of 1.5 was established. When this correction factor was applied, 70% of the analyzer-developed values were within 0.5 g/100 ml of those obtained electrophoretically. Albumin-to-globulin ratios (A/G) obtained by the 2 methods were comparable. The findings indicate that analytical data obtained from the semiautomated analyzer for albumin are useful in determining whether the more definitive electrophoretic fractionation of serum protein is necessary.

Abstract: The reliability of radiation switches is improved in accordance with this invention by mechanically modifying the contact members of the switch structure to reduce the heat sinking effectiveness of the switch contact members.