TL;DR: In this paper, the authors present a comparison of the main two-wave interferometric systems and their configurations used in optical testing and digital image processing, as well as some useful Spatial Filters.
Abstract: (condensed). Review and Comparison of the Main Interferometric Systems: Two-Wave Interferometers and Configurations Used in Optical Testing. Twyman-Green Interferometer. Fizeau Interferometers. Typical Interferograms in Twyman-Green and Fizeau Interferometers. Lateral Shear Interferometers. Ronchi Test. Hartmann Test. Fringe Projection. Talbot Interferometry and Moire Deflectometry. Common Light Sources Used in Interferometry. Aspherical Compensators and Aspheric Wavefronts. Imaging of the Pupil on the Observation Plane. Multiple-Wavelength Interferometry. Fourier Theory Review: Introduction. Fourier Series. Fourier Transforms. The Convolution of Two Functions. The Cross-Correlation of Two Functions. Sampling Theorem. Sampling of a Periodical Function. Sampling of a Periodical Function with Interval Averaging. Fast Fourier Transform. Digital Image Processing: Introduction. Histogram and Gray-Scale Transformations. Space and Frequency Domain of Interferograms. Digital Processing of Images. Some Useful Spatial Filters. Square Window Filter. Hamming and Hanning Window Filters. Cosinusoidal and Sinusoidal Window Filters. Extrapolation of Fringes Outside of the Pupil. Light Detectors Used To Digitize Images. Fringe Contouring and Polynomial Fitting: Fringe Detection Using Manual Digitizers. Fringe Tracking and Fringe Skeletonizing. Global Polynomial Interpolation. Local Interpolation by Segments. Wavefront Representation by an Array of Gaussians.References. Periodic Signal Phase Detection and Algorithms Analysis: Least Squares Phase Detection of a Sinusoidal Signal. Quadrature Phase Detection of a Sinusoidal Signal. Discrete Low-Pass Filtering Functions. Fourier Description of Synchronous Phase Detection. Synchronous Detection Using a Few Sampling Points. Signal Amplitude Measurement. Characteristic Polynomial of a Sampling Algorithm. General Error Analysis of Synchronous Phase-Detection Algorithms. Some Sources of Phase Error. Shifting Algorithms with Respect to the Phase Origin. Optimization of Phase-Detection Algorithms. Influence of Window Function of Sampling Algorithms. Conclusions. Appendix: Derivative of the Amplitude of the Fourier Transform of the Reference Sampling Functions. References. Phase-Detection Algorithms: General Properties of Synchronous Phase-Detection Algorithms. Three-Step Algorithms To Measure the Phase. Four-Step Algorithms To Measure the Phase. Five-Step Algorithm. Algorithms with Symmetrical N +1 Phase Steps. Combined Algorithms in Quadrature. Detuning-Insensitive Algorithms for Distorted Signals. Algorithms Corrected for Nonlinear Phase-Shifting Error. Continuous Sampling in a Finite Interval. Asynchronous Phase-Detection Algorithms. Algorithm Summary. References. Phase-Shifting Interferometry: Phase-Shifting Basic Principles. An Introduction to Phase Shifting. Phase-Shifting Schemes and Phase Measurement. Heterodyne Interferometry. Phase-lock Detection. Sinusoidal Phase Oscillation Detection. Practical Sources of Phase Error. Selection of the Reference Sphere in Phase-Shifting Interferometry. Paraxial Focus. Best Focus. Marginal Focus. Optimum Tilt and Defocusing in Phase-Shifting Interferometry. References. Spatial Linear and Circular Carrier Analysis: Spatial Linear Carrier Analysis. Space-Domain Phase Demodulation with a Linear Carrier. Basic Space-Domain Phase Demodulation Theory. Circular Spatial Carrier Analysis. Phase Demodulation with a Circular Carrier. Fourier Transform Phase Demodulation with a Linear Carrier. Fourier Transform Phase Demodulation with a Circular Carrier. References. Interferogram Analysis with Moire Methods: Moire Techniques. Moire Formed by Two Interferograms with a Linear Carrier. Moire Formed by Two Interferograms with a Circular Carrier. Summary of Moire Effects. Holographic Interpretation of Moire Patterns. Conclusion. References. Interferogram Analysis without a Carrier: Introduction. Mathematical Model of the Fringes. The Phase Tracker. The N-Dimensional Quadrature Transform. Conclusion. References. Phase Unwrapping: The Phase Unwrapping Problem. Unwrapping Consistent Phase Maps Unwrapping Noisy Phase Maps. Unwrapping Subsampled Phase Maps. Conclusions. References. Wavefront Curvature Sensing: Wavefront Determination by Slope Sensing. Wavefront Curvature Sensing. Wavefront Determination with Defocused Images. Conclusions. References. Index. Short TOC
TL;DR: In this paper, the authors present a historical background introduction to Moire metrology techniques used in Moire deflectometry applications, including the use of light holographic vs Moire contouring of three-dimensional diffusive objects.
Abstract: Historical background introduction to Moire metrology techniques used in Moire metrology limitations on accuracy due to the use of light holographic vs Moire contouring of three-dimensional diffusive objects Moire analysis of strain Moire deflectometry applications of Moire deflectometry.
TL;DR: Mapping of temperature of a premixed hydrogen-oxygen flame by moire deflectometry is demonstrated, based on deflection mapping of rays from a collimated light beam due to gradients of the refractive index across the flame.
Abstract: Mapping of temperature of a premixed hydrogen-oxygen flame by moire deflectometry is demonstrated. The technique is based on deflection mapping of rays from a collimated light beam due to gradients of the refractive index across the flame. For an axially symmetric flame the radial distribution of the refractive index was derived by Abel transformation. The temperature profile of the flame was calculated for a known gas composition assuming ideal gas behavior.
TL;DR: In this article, a novel technique, moire deflectometry, for ray deflection mapping is presented, which is used for diagnostics of phase objects and specular surfaces, for shearing analysis, for microscopy, and for MTF determination.
Abstract: A novel technique, moire deflectometry, for ray deflection mapping is presented. Numerous experimental techniques for diagnostics of phase objects and specular surfaces, for shearing analysis, for microscopy, and for MTF determination, based on moire deflectometry, are described. The wide range of applications encompasses laser beam diagnostics, characterization of optical components, flow visualization in wind tunnels, temperature mapping of flames, turbulence study, and real-time tracking of transient phenomena like thermal lensing.
TL;DR: In this paper, the authors derived bounds on the sensitivity and resolution of moire deflectometry caused by diffraction effects from the wave equation and showed that Fresnel diffraction is a necessary and sufficient framework for treating these effects.
Abstract: The bounds on the sensitivity and resolution of moire deflectometry caused by diffraction effects are derived from the wave equation. It is shown that Fresnel diffraction is a necessary and sufficient framework for treating these effects. Expressions are given for angular resolution, spatial resolution, and dynamic range. The proper selection of experimental parameters involves a trade-off between the angular resolution on the one hand and spatial resolution and dynamic range on the other.