Misorientation

Abstract: The critical current densities across grain boundaries have been measured as a function of misorientation angle in the basal plane of bicrystals of $\mathrm{Y}{\mathrm{Ba}}_{2}{\mathrm{Cu}}_{3}{\mathrm{O}}_{7\ensuremath{-}\ensuremath{\delta}}$ For small misorientation angles, the ratio of the grain-boundary critical current density to the bulk critical current density is roughly proportional to the inverse of the misorientation angle; for large angles, this ratio saturates to a value of about $\frac{1}{50}$ These results imply that achieving a high degree of texture both normal to and within the basal plane is important for the obtaining of very high critical currents in pure polycrystalline samples

Abstract: Part I: Fundamental Issues Introduction The Classical Approach to Texture The Modern Approach to Texture: Microtexture A Guide to the Book Descriptors of Orientation Crystal Structures and Crystal Symmetries Transformation between Coordinate Systems: The Rotation Matrix The "Ideal Orientation" (Miller or Miller-Bravais Indices) Notation The Reference Sphere, Pole Figure, and Inverse Pole Figure The Euler Angles and Euler Space The Angle/Axis of Rotation and Cylindrical Angle/Axis Space The Rodrigues Vector and Rodrigues Space Application of Diffraction to Texture Analysis Diffraction of Radiation and Bragg's Law Structure Factor Laue and Debye-Scherrer Methods Absorption and Depth of Penetration Characteristics of Radiations Used for Texture Analysis Part II: Macrotexture Analysis Macrotexture Measurements Principle of Pole Figure Measurement X-Ray Diffraction Methods Neutron Diffraction Methods Texture Measurements in Low-Symmetry and Multiphase Materials Sample Preparation Evaluation and Representation of Macrotexture Data Pole Figure and Inverse Pole Figure Determination of the Orientation Distribution Function from Pole Figure Data Representation and Display of Texture in Euler Space Examples of Typical Textures in Metals Part III: Microtexture Analysis The Kikuchi Diffraction Pattern The Kikuchi Diffraction Pattern Quantitative Evaluation of the Kikuchi Pattern Pattern Quality Scanning Electron Microscopy-Based Techniques Micro-Kossel Technique Electron Channeling Diffraction and Selected-Area Channeling Evolution of Electron Backscatter Diffraction EBSD Specimen Preparation Experimental Considerations for EBSD Calibration of an EBSD System Operation of an EBSD System and Primary Data Output Transmission Electron Microscopy-Based Techniques High-Resolution Electron Microscopy Selected Area Diffraction Kikuchi Patterns, Microdiffraction, and Convergent Beam Electron Diffraction Evaluation and Representation of Microtexture Data Representation of Orientations in a Pole Figure or Inverse Pole Figure Representation of Orientations in Euler Space Representation of Orientations in Rodrigues Space General Representation of Misorientation Data Representation of Misorientations in Three-Dimensional Spaces Normalization and Evaluation of the Misorientation Distribution Function Extraction of Quantified Data Orientation Microscopy and Orientation Mapping Historical Evolution Orientation Microscopy Orientation Mapping and Its Applications Orientation Microscopy in the TEM Crystallographic Analysis of Interfaces, Surfaces, and Connectivity Crystallographic Analysis of Grain Boundaries Crystallographic Analysis of Surfaces Orientation Connectivity and Spatial Distribution Orientation Relationships between Phases Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods Texture Analysis by Synchrotron Radiation Texture Analysis by Nondiffraction Techniques Appendices Glossary References General Bibliography Index