Input offset voltage

Abstract: A latch-type voltage sense amplifier in 90nm CMOS is designed with a separated input and cross-coupled stage. This separation enables fast operation over a wide common-mode and supply voltage range. With a 1-sigma offset of 8mV, the circuit consumes 92fJ/decision with a 1.2V supply. It has an input equivalent noise of 1.5mV and requires 18ps setup-plus-hold time

Abstract: This paper presents a two-stage, compact, power-efficient 3 V CMOS operational amplifier with rail-to-rail input and output ranges. Because of its small die area of 0.04 mm/sup 2/, it is very suitable as a VLSI library cell. The floating class-AB control is shifted into the summing circuit, which results in a noise and offset of the amplifier which are comparable to that of a three stage amplifier. A floating current source biases the combined summing circuit and the class-AB control. This current source has the same structure as the class-AB control which provides a power-supply-independent quiescent current. Using the compact architecture, a 2.6 MHz amplifier with Miller compensation and a 6.4 MHz amplifier with cascoded-Miller compensation have been realized. The opamps have, respectively, a bandwidth-to-supply-power ratio of 4 MHz/mW and 11 MHz/mW for a capacitive load of 10 pF. >

Abstract: A quantitative yield analysis of a latch-type voltage sense amplifier with a high-impedance differential input stage is presented. It investigates the impact of supply voltage, input DC level, transistor sizing, and temperature on the input offset voltage. The input DC level turns out to be most significant. Also, an analytical expression for the sensing delay is derived which shows low sensitivity on the input DC bias voltage. A figure of merit indicates that an input dc level of 0.7 V/sub DD/ is optimal regarding speed and yield. Experimental results in 130-nm CMOS technology confirm that the yield can be significantly improved by lowering the input DC voltage to about 70% of the supply voltage. Thereby, the offset standard deviation decreases from 19 to 8.5 mV without affecting the delay.

Abstract: This paper presents a low offset voltage, low noise dynamic latched comparator using a self-calibrating technique. The new calibration technique does not require any amplifiers for the offset voltage cancellation and quiescent current. It achieves low offset voltage of 1.69 mV at 1 sigma in low power consumption, while 13.7 mV is measured without calibration. Furthermore the proposed comparator requires only one phase clock while conventionally two phase clocks were required leading to relaxed clock. Moreover, a low input noise of 0.6 mV at 1 sigma, three times lower than the conventional one, is obtained. Prototype comparators are realized in 90 nm 10M1P CMOS technology. Experimental and simulated results show that the comparator achieves 1.69 mV offset at 250 MHz operating, while dissipating 40 muW/GHz ( 20 fJ/conv. ) from a 1.0 V supply.