Topic
Electron microprobe
About: Electron microprobe is a research topic. Over the lifetime, 3103 publications have been published within this topic receiving 61232 citations. The topic is also known as: Electron Probe Micro Analyzer.
Papers published on a yearly basis
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Papers
TL;DR: In this paper, chemical analyses of twenty-six minerals, four natural glasses, and one synthetic glass were presented for use as microprobe reference samples, and details of sample preparation were described and homogeneity of the samples has been tested by the homogeneity index.
Abstract: The chemical analyses of twenty-six minerals, four natural glasses, and one synthetic glass prepared for use as microprobe reference samples are presented New chemical analyses of minerals and revised analyses of several minerals published previously are included Details of sample preparation are described and the homogeneity of the samples has been tested by the homogeneity index
1,171 citations
Book•
5 Jun 1975
TL;DR: In this article, the electron microprobe was used for energy-dispersive analysis of X-ray spectrometers, and it was shown that the resulting analysis can be used to identify the origin of characteristic X-rays.
Abstract: 1. Introduction 2. Essential features of the electron microprobe 3. Electron gun 4. The probe-forming system 5. Scanning 6. Wavelength-dispersive spectrometers 7. Proportional counters 8. Counting electronics 9. Lithium-drifted silicon detectors 10. Electronics for energy-dispersive systems 11. Wavelength-dispersive analysis 12. Energy-dispersive analysis 13. X-ray generation and stopping power 14. Electron backscattering 15. Absorption corrections 16. Fluorescence corrections 17. Matrix corrections in practice 18. Light element analysis Appendix: origin of characteristic X-rays.
789 citations
1 Jan 1991
TL;DR: Early Times of Electron Microprobe Analysis as discussed by the authors... The use of tracer experiments and Monte Carlo calculations in the determination for Electron Probe Microanalysis has been extensively studied in the literature.
Abstract: Early Times of Electron Microprobe Analysis.- Strategies of Electron Probe Data Reduction.- An EPMA Correction Method Based upon a Quadrilateral ?(?z) Profile.- Quantitative Analysis of Homogeneous or Stratified Microvolumes Applying the Model "PAP".- ?(?z) Equations for Quantitative Analysis.- A Comprehensive Theory of Electron Probe Microanalysis.- A Flexible and Complete Monte Carlo Procedure for the Study of the Choice of Parameters.- Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen).- Nonconductive Specimens in the Electron Probe Microanalyzer - A Hitherto Poorly Discussed Problem.- The R Factor: The X-Ray Loss due to Electron Backscatter.- The Use of Tracer Experiments and Monte Carlo Calculations in the ?(?z) Determination for Electron Probe Microanalysis.- Effect of Coster-Kronig Transitions on X-Ray Generation.- Uncertainties in the Analysis of M X-Ray Lines of the Rare-Earth Elements.- Standards for Electron Probe Microanalysis.- Quantitative Elemental Analysis of Individual Microparticles with Electron Beam Instruments.- The f(?) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters.- Quantitative Compositional Mapping with the Electron Probe Microanalyzer.- Quantitative X-Ray Microanalysis in the Analytical Electron Microscope.
700 citations
TL;DR: In this article, aluminum-doped zinc oxide films have been deposited on soda lime glass substrates from diethyl zinc, triethyl aluminum, and ethanol by atmospheric pressure chemical-vapor deposition in the temperature range 367-444°C.
Abstract: Aluminum‐doped zinc oxide films have been deposited on soda lime glass substrates from diethyl zinc, triethyl aluminum, and ethanol by atmospheric pressure chemical‐vapor deposition in the temperature range 367–444 °C. Film roughness was controlled by the deposition temperature and the dopant concentration. The films have resistivities as low as 3.0 × 10−4 Ω cm, infrared reflectances close to 90%, visible transmissions of 85%, and visible absorptions of 5.0% for a sheet resistance of 4.0 Ω/⧠. The aluminum concentration within doped films measured by electron microprobe is between 0.3 and 1.2 at. %. The electron concentration determined from Hall coefficient measurements is between 2.0 × 1020 and 8.0 × 1020 cm−3, which is in agreement with the estimates from the plasma wavelength. The Hall mobility, obtained from the measured Hall coefficient and dc resistivity, is between 10.0 and 35.0 cm2/V s. Over 90% of the aluminum atoms in the film are electrically active as electron donors. Scanning electron microscopy and x‐ray diffraction show that the films are crystalline with disklike structures of diameter 100–1000 nm and height 30–60 nm. The films have the desired electrical and optical properties for applications in solar cell technology and energy efficient windows.
625 citations
Book•
31 May 1996TL;DR: In this article, the authors present a survey of electron microscopy and X-ray spectrometers, including electron-specimen interactions, element mapping, and element-based analysis.
Abstract: Preface Acknowledgements 1. Introduction 2. Electron-specimen interactions 3. Instrumentation 4. Scanning electron microscopy 5. X-ray spectrometers 6. Element mapping 7. X-ray analysis (1) 8. X-ray analysis (2) 9. Sample preparation Appendix References Index.
623 citations
Related Topics (5)
Performance Metrics
| Year | Papers |
|---|---|
| 2026 | 1 |
| 2025 | 29 |
| 2024 | 68 |
| 2023 | 254 |
| 2022 | 430 |
| 2021 | 59 |