Double layer forces

Abstract: THE forces between colloidal particles dominate the behaviour of a great variety of materials, including paints, paper, soil, clays and (in some circumstances) cells. Here we describe the use of the atomic force microscope to measure directly the force between a planar surface and an individual colloid particle. The particle, a silica sphere of radius 3.5 µm, was attached to the force sensor in the microscope and the force between the particle and the surface was measured in solutions of sodium chloride. The measurements are consistent with the double-layer theory1,2 of colloidal forces, although at very short distances there are deviations that may be attributed to hydration forces3–6 or surface roughness, and with previous studies on macroscopic systems4–6. Similar measurements should be possible for a wide range of the particulate and fibrous materials that are often encountered in industrial contexts, provided that they can be attached to the microscope probe.

Abstract: A direct measurement has been made of the forces in air between two cylindrical sheets of mica arranged with their axes mutually at right angles. The contact resembles that between a sphere and a flat. The mica sheets are glued to glass formers, their concave face being first slightly silvered. The contact region and the distance of approach are measured by multiple beam interferometry using fringes of equal chromatic order (f. e. c. o.). This gives an accuracy for the distances between the surfaces of ± 0.3 nm. Since the surfaces are molecularly smooth it is possible to bring them very close to one another. One surface is held on a rigid support, the other on a light cantilever beam. The surfaces are slowly brought together and at a critical separation ‘flick’ together. The ‘flick’ distance depends on the stiffness of the cantilever and this in turn provides a direct measure of the surface forces. By using cantilevers of different stiffnesses the method has proved effective for separations ranging from 5 to 30 nm. The results show that for separations less than about 10 nm the forces operating are ‘normal’ van der Waals forces whilst for distances greater than 20 nm they are ‘retarded’ van der Waals forces.