About: Degenerate semiconductor is a research topic. Over the lifetime, 466 publications have been published within this topic receiving 9829 citations.
TL;DR: In this article, a degenerate semiconductor material with a basic material having a bandgap between conduction band (11) and valence band (12) of electrons greater than 2.5 eV was presented.
Abstract: A semiconductor device includes a transparent switching element (1) with two connection electrodes (2, 3) of a transparent material and an interposed transparent channel region (4) of a semiconductor material provided with a transparent gate electrode (5) of a conductive material, separated from the channel region (4) by a transparent insulating layer (6). The semiconductor material is a degenerate semiconductor material with a basic material having a bandgap (10) between conduction band (11) and valence band (12) of electrons greater than 2.5 eV and a mobility of charge carriers greater than 10 cm2 /Vs provided with dopant atoms which form a fixed impurity energy level (13) adjacent or in the valence band (12) or conduction band (11) of the basic material. The degenerate semiconductor material is transparent because the absorption of visible light is not possible owing to the great bandgap (10), while also no absorption of visible light takes place through the impurity energy levels (13). The device is capable of comparatively fast switching.
TL;DR: The piezoresistive properties of n and p-type diffused layers formed by the diffusion of impurities into silicon have been investigated in this paper, and the results show a change in the symmetry and the temperature dependence of the large coefficients.
Abstract: The piezoresistive properties of n‐ and p‐type layers formed by the diffusion of impurities into silicon have been investigated. The values of the three piezoresistance coefficients and the temperature dependence of the large coefficients have been measured on layers having surface concentration values from 1018 to 1021 cm−3. The piezoresistance effect in p‐type diffused layers follows qualitatively the behavior expected in a degenerate semiconductor. n‐type layers having high surface concentration values show a change in the symmetry of the piezoresistance effect at room temperature and a decrease in the coefficient π11 at lower temperatures. A discussion of the piezoresistance effect in diffused layers and its relation to the piezoresistance effect in uniformly doped material is also given.
TL;DR: This work demonstrates the polarization of the conduction bands and indicates that, when ZnO is doped into the metallic regime, it behaves as a genuine magnetic semiconductor.
Abstract: Films of ZnO doped with magnetic ions Mn and Co and, in some cases, with Al have been fabricated with a very wide range of carrier densities. Ferromagnetic behavior is observed in both insulating and metallic films, but not when the carrier density is intermediate. Insulating films exhibit variable range hopping at low temperatures and are ferromagnetic at room temperature due to the interaction of the localized spins with static localized states. The magnetism is quenched when carriers in the localized states become mobile. In the metallic (degenerate semiconductor) range, robust ferromagnetism reappears together with very strong magneto-optic signals and room temperature anomalous Hall data. This demonstrates the polarization of the conduction bands and indicates that, when ZnO is doped into the metallic regime, it behaves as a genuine magnetic semiconductor.
TL;DR: In this article, the physical properties of al-doped zinc oxide (AZO) films are investigated in terms of the preparation conditions, such as Al2O3 content in the target, RF power (PRF), substrate temperature (Ts), and working pressure (Pw).
TL;DR: In this paper, a low-temperature lanthanum telluride (La3−xTe4) was synthesized via mechanical alloying and characterized for thermoelectric performance.
Abstract: Lanthanum telluride (La3−xTe4) has been synthesized via mechanical alloying and characterized for thermoelectric performance. This work confirms prior reports of lanthanum telluride as a good high-temperature thermoelectric material, with zT~1.1 obtained at 1275 K. The thermoelectric performance is found to be better than that of SiGe, the current state-of-the-art high-temperature n-type thermoelectric material. Inherent self-doping of the system allows control over carrier concentration via sample stoichiometry. Prior high-temperature syntheses were prone to solute rejection in liquid and vapor phases, which resulted in inhomogeneous chemical composition and carrier concentration. The low-temperature synthesis provides homogeneous samples with acceptable control of the stoichiometry, and thus allows a thorough examination of the transition from a heavily doped degenerate semiconductor to a nondegenerate semiconductor. The effect of carrier concentration on the Hall mobility, Seebeck coefficient, thermal and electrical conductivity, lattice thermal conductivity, and thermoelectric compatibility are examined for 0.03<=x<=0.33.