Patent
Three-dimensional measuring machine
Sanehiro Ishikawa,修弘 石川,Hideyuki Nakagawa,英幸 中川 +3 more
- 05 Jul 2011
5
TL;DR: In this paper, a three-dimensional measuring machine capable of always calculating a highly accurate correction parameter is proposed, which includes restriction means for restricting translational displacement of the gauge head and movement control means for moving the gauge heads in a direction approaching the abutting face 611 by controlling operation of a driving mechanism and moving a probe 21; information acquisition means for acquiring movement quantity of the probe 21 and movement quantities of the driving mechanism.
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Abstract: PROBLEM TO BE SOLVED: To provide a three-dimensional measuring machine capable of always calculating a highly accurate correction parameterSOLUTION: A correction parameter calculation apparatus 10 composing the three-dimensional measuring machine includes: restriction means 6 having an abutting face 611 on which a gauge head 211A abuts and capable of restricting translational displacement of the gauge head 211A by abutting the gauge head 211A on the abutting face 611 without restricting rotational displacement around the center of the gauge head 211A; movement control means for moving the gauge head 211A in a direction approaching the abutting face 611 by controlling operation of a driving mechanism and moving a probe 21; information acquisition means for acquiring movement quantity of the probe 21 and movement quantity of the driving mechanism; and correction parameter calculation means for calculating a correction parameter based on the movement quantity of the probe 21 and the movement quantity of the driving mechanism which are acquired by the information acquisition means When the gauge head 211A abuts on the abutting face 611, the abutting face 611 is brought into point-contact with one point of the gauge head 211A
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Citations
Patent
Coordinate measuring machine and method for calculating correction matrix by coordinate measuring machine
Hideyuki Nakagawa,Nobuhiro Ishikawa +1 more
- 13 Feb 2015
TL;DR: In this article, the first and second detection values are obtained by measurement in which a calibration reference body and the probe are moved relatively to each other in a normal direction on a surface of the calibrated reference body.
10
Patent
Coordinate measuring machine and coordinate correction method
Hideyuki Nakagawa,Nobuhiro Ishikawa +1 more
- 18 Aug 2017
TL;DR: In this article, a coordinate acquisition unit that acquires a moving amount of a measuring probe and a probe output was proposed, and a matrix generation unit that generated a correction matrix including linear correction elements and non-linear correction elements.
3
Patent
Coordinate correction method and coordinate measuring machine
Hideyuki Nakagawa,Nobuhiro Ishikawa +1 more
- 22 Aug 2017
TL;DR: In this article, a coordinate correction method for non-linear error correction of the probe output supplied from the measuring probe is proposed. But it does not address the nonlinear error of the output supplied by the probe itself.
1
Patent
Three-dimensional measurement device and coordinate correction method
中川 英幸,Hideyuki Nakagawa,英幸 中川,修弘 石川,Sanehiro Ishikawa +4 more
- 26 Aug 2016
TL;DR: In this paper, the shape coordinates of a measurement object are obtained with high accuracy as a nonlinear error of probe output output outputted from a measurement probe is correctable, and a processing device 400 comprises: a coordinate acquisition unit 406 for acquiring each of the movement amount M and probe output P of a probe 300 when the measurement probe 300 is moved by a drive mechanism 220 while a gauge head 306 is restricted by restricting means 240; a matrix generation unit 408 for generating a correction matrix AA composed of a linear correction element and nonlinear correction element for correcting the linear coordinate component
Patent
Coordinate correction method and three-dimensional measurement device
Hideyuki Nakagawa,Ishikawa Sanehiro +1 more
- 01 Mar 2018
TL;DR: In this paper, a coordinate correction method and a three-dimensional measurement device are proposed to simplify a correction carried out immediately before measurement while making it possible to correct the nonlinear error of probe output outputted from a measurement probe.
References
Patent
Analog probe correcting method and instrument for the same
Deibitsuto Gurahamu Paurii
- 21 Nov 1990
TL;DR: In this paper, the position of a stylus in the device coordinate system and the position in the probe coordinate system is estimated by fitting a ball body to the surface of a measuring block and arranging it in a regular triangle.
8
Patent
Three-dimensional measurement machine
Hagino Takeshi
- 01 Jul 2010
TL;DR: In this article, a three-dimensional measurement machine with a probe 21, a drive mechanism, and a correction parameter calculation device is presented, which is capable of shortening the time required in calculating the correction parameter and improving measurement accuracy.
6
Patent
Calibration method and program for creating calibration execution program for measurement device
Kato Koichi,Takamasa Ito,Sumiteru Mikami +2 more
- 28 Dec 2006
TL;DR: In this article, the direction of the normal vector is estimated only regarding the normal vectors by acquiring it only at designated measurement points on the surface of the measurement object, and the calibration is performed only regarding this direction.
4
Patent
Measuring system using displacement detecting type measuring head
Kurahashi Yasuhiro,Takeuchi Yuzo +1 more
- 08 Aug 1995
TL;DR: In this article, a measuring system consisting of an interface circuit for a displacement detecting type measuring head, a memory circuit for storing calibration data composed of compensating coefficients and compensating values, and a compensating circuit 15 for compensating data for displacement value of the measuring head 5 in view of displacement data delivered from the interface circuit 11 and the calibration data stored in the memory circuit 13 and corresponding to the head.
3
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