Patent
Testing device and connection device
智行 ▲高▼本,Junji Enohara,Takahide Nishiura,Takamoto Tomoyuki,Satoru Takeshita,Hidehiko Yasuno,秀彦 安野,淳二 榎原,覚 竹下,孝英 西浦 +9 more
- 13 Apr 2010
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TL;DR: In this article, a test head incorporating a test module for testing the device to be tested and a function board connected through a cable to the test module in the test head and connected to the socket board is presented.
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Abstract: PROBLEM TO BE SOLVED: To achieve a high speed and high functionalization of an existing testing device at a low cost by means of an addition circuit.SOLUTION: The testing device is connected to a socket board according to the kind of device to be tested and tests the device to be tested, and includes: a test head incorporating a test module for testing the device to be tested; a function board connected through a cable to the test module in the test head and connected to the socket board; an addition circuit mounted on the function board and connected to the test module and the device to be tested.
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Citations
Patent
Вспомогательное оборудование для тестирования полупроводниковых интегральных схем
Рябцев Владимир Григорьевич,Волобуев Сергей Васильевич,Евдокимов Алексей Петрович +2 more
- 07 Feb 2018
TL;DR: In this paper, the authors proposed a method to improve the quality of the information provided by the users. But they did not specify how to obtain the information of the users' preferences.
References
Patent
Dut substrate cooling system
Nishiuchi Yoshitake
- 20 Aug 2009
TL;DR: In this paper, a DUT substrate cooling system for cooling DUT substrates is presented, which includes a cooling channel disposed in the substrate and a cooling fluid supply for receiving supply of cooling fluid from the test head.
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