Proceedings Article10.1109/CCATS.2015.30
Surface Roughness Measurement Application Using Multi-frame Techniques
Tanaporn Leelawattananon,Warawoot Thowladda,Suphamit Chittayasothorn +2 more
- 31 Aug 2015
- pp 12
10
TL;DR: In this paper, the phase shifting interference (PSI) technique is applied for the roughness measurement of highly smooth surfaces using a 0.5 mW He-Ne laser source with the wavelength of 632.8 nm.
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Abstract: This paper presents a computer application of the surface roughness measurement of highly smooth surfaces. The Phase Shifting Interferometry technique which is a non-contact technique is applied for the roughness measurement. Our optic-based measurement system utilizes a 0.5 mW He-Ne laser source with the wavelength of 632.8 nm. Fringes from the measurement system were recorded using a high precision camera and were analyzed by our programs to produce the surface roughness measurement. This technique is a simple technique which gives accurate results. It is a four-frame algorithm giving similar results to the more complex five-frame one with less processing time.
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References
Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
TL;DR: In this paper, a fast Fourier transform method of topography and interferometry is proposed to discriminate between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour generation techniques.
4.5K
•Journal Article
Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
TL;DR: In this article, a fast Fourier transform method of topography and interferometry is proposed to discriminate between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour generation techniques.
3.7K
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1.3K
•Journal Article
Digital wavefront measuring interferometer for testing optical surfaces and lenses
TL;DR: In this article, a self-scanned 1024 element photodiode array and a minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100.
1.3K