Patent
Scanning-type probe microscope
Akira Egawa,Tatsuya Miyatani,Kunio Nakajima,邦雄 中島,竜也 宮谷,明 江川 +5 more
- 04 Mar 1999
17
TL;DR: In this article, the authors proposed to obtain high detection sensitivity without fixing a probe and a piezoelectric body in one piece by flexibly pinching the probe with first and second elastic bodies.
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Abstract: PROBLEM TO BE SOLVED: To obtain high detection sensitivity without fixing a probe and a piezoelectric body in one piece by flexibly pinching the probe with first and second elastic bodies and allowing the first elastic body to have a piezoelectric body. SOLUTION: In an elastic body 201 for pinching a probe 101 flexibly, a piezoelectric body 202 is formed on a surface, and an elastic body 206 also plays a role of a vibrator. A probe 101 that is excited up and down in the elastic body 206 is bent and vibrated with a part in contact with the elastic body 201 as a support, and at the same time the elastic body 201 causes bending deformation with the contact part as a pressure cone apex since compliance is large. Therefore, at the moment when the probe 101 moves up and down, the elastic body 201 is bent and deformed in a peripheral direction, the piezoelectric body 202 expands and contracts to generate a bipolar voltage. In this case, when the frequency of the elastic body 206 is swept, the vibration amplitude of the probe 101 increases closer to a mechanical, natural frequency. As the amplitude increases, the expansion and contraction of the piezoelectric body 202 also increases and a generated voltage increases. By monitoring the change in the generated voltage, the resonance characteristics of the probe 101 can be detected.
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Citations
Patent
Scanning probe microscope
Shin-ichi Kitamura,Takashi Sueyoshi +1 more
- 08 Jul 1998
TL;DR: In this paper, the tip of the probe of a scanning probe microscope cannot be conditioned stably due to overload in a contact region, and the problem is solved by a scanner for scanning the probe and a sample relative to each other.
69
Patent
Method and apparatus of operating a scanning probe microscope
Yan Hu,Shuiqing Hu,Chanmin Su +2 more
- 13 Nov 2009
TL;DR: In this paper, an improved peak force tapping (PFT) mode was proposed to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing AFM operating modes.
49
Patent
Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
Jian Shi,Yan Hu,Shuiqing Hu,Ji Ma,Chanmin Su +4 more
- 29 Nov 2011
TL;DR: In this article, an improved peak force tapping (PFT) mode is proposed to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing AFM operating modes.
39
Patent
Scanning probe microscope
Mervyn J Miles,Andrew D. L. Humphris,Jamie K. Hobbs +2 more
- 04 Jul 2003
TL;DR: In this article, a scanning probe microscope detects or induces changes in a probe-sample interaction by means of capacitance developed at an interface between a metallic probe and the sample surface.
26
Patent
PeakForce photothermal-based detection of IR nanoabsorption
Gregory O. Andreev
- 10 Feb 2015
TL;DR: In this article, an apparatus and method of performing photothermal chemical nano-identification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample separation being less than about 10 nm.
10
References
Patent
Scanning near field optical microscope
Eisuke Tomita
- 12 Mar 1997
TL;DR: In this article, a scanning near-field optical microscope has an optical waveguide probe, a vibration device having a piezoelectric vibrating body and an AC voltage generator for vibrating the probe relative to a surface of a sample.
88
Patent
Scanning probe microscope
Hiroshi Yamaguchi,Matsunaga Hideki,Masahiko Yoshiki,Suzuki Takeshi,Mitsuhiro Tomita,Takakuwa Chie,Mamoru Takahashi +6 more
- 22 Sep 1997
TL;DR: In this paper, the authors presented a scanning probe microscope with a supporting stage and a probe, which can separately detect atomic force and frictional force efficiently, can analyze and evaluate the differences in shape, composition and structure of the surfaces of materials and can perform the precise position detection even in the machining process and recording at the atomic and molecular levels.
34
Patent
Scanning probe microscope
Masato Iyoki,Naokatsu Nosaka,Hiroumi Momota,Junji Kuwahara +3 more
- 31 Jul 1998
TL;DR: In this article, a scanning probe microscope including a cantilever, a three-dimensional moving mechanism moving a sample stage in three dimensions, and a measurement chamber sealed not to be exposed to external air is described.
17
Patent
Optical waveguide probe and optical system
Hiroshi C,Kunio C +1 more
- 13 Feb 1997
TL;DR: In this paper, a planar optical waveguide was formed, its tip was sharpened, and a piezoelectric detection mechanism was provided for near field optical microscopy.
16
Patent
Cantilever with force displacement sensor
Nobuhiro Shimizu,Yoshiharu Shirakawabe,Hiroshi Takahashi,信宏 清水,喜春 白川部,寛 高橋 +5 more
- 14 May 1996
TL;DR: In this paper, a U-shaped resistance layer 5 is formed on the lever part 2 corresponding to the constricted parts 4a and 4b, which are formed by cutting the lever parts 2 across the width or by making it thinner.
11
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