Book Chapter10.1002/9783527619283.CH13B
Scanning Force Microscopy
S. Amelinckx,D. van Dyck,J. van Landuyt,G. Van Tendeloo +3 more
- 27 Dec 1996
- pp 828-844
18
About: The article was published on 27 Dec 1996.
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Citations
Dynamic microprobing of viscoelastic polymer properties
TL;DR: In this paper, the Hertzian model of elastic contacts was used to obtain Young's modulus at contact frequencies range 0.05-367 Hz, and the absolute values of the elastic modulus were correlated with the known properties of bulk materials, with no frequency dependence detected for glassy polyvinylchloride and polystyrene in air.
Atomic force and scanning tunneling microscopies of organic surfaces
TL;DR: In this article, the potential of the atomic force microscopy (AFM) to measure the local elastic and tribological properties of organic surfaces is demonstrated and the effects of tip/surface interactions that result in local surface modifications and image alterations are discussed.
35
Structural studies of ordered monolayers using atomic force microscopy
N.M. Peachey,C.J. Eckhardt +1 more
TL;DR: The Langmuir-Blodgett (LB) films are thin organic layers formed by transferring a monolayer of amphiphiles from the surface of an aqueous subphase onto a solid substrate as mentioned in this paper.
15
SFM Studies of the Surface Morphology of ICE
TL;DR: In this paper, the surface of ice was studied using nanoScope III in the temperature range from -2 to -25°C and the problem of surface melting at higher temperatures was analyzed.
13
References
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
13.6K
Surface energy and the contact of elastic solids
TL;DR: In this paper, the influence of surface energy on the contact between elastic solids is discussed and an analytical model for its effect upon the contact size and the force of adhesion between two lightly loaded spherical solid surfaces is presented.
7.9K
Surface studies by scanning tunneling microscopy
TL;DR: In this paper, surface microscopy using vacuum tunneling has been demonstrated for the first time, and topographic pictures of surfaces on an atomic scale have been obtained for CaIrSn 4 and Au.
4.8K
Effect of contact deformations on the adhesion of particles
TL;DR: In this article, it was shown that despite the van der Waals' forces being capable of increasing the elastic contact area between the ball and the plane, the force that is required to overcome the molecular forces arising when the contact is broken does not increase thereby.
4.3K
Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity
TL;DR: In this article, a frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum (<10−3 Torr).
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