Pruning-based trace signal selection algorithm
Kang Zhao,Jinian Bian +1 more
- 25 Jan 2011
- pp 639-644
TL;DR: An automated trace signal selection algorithm is proposed, which uses the pruning-based strategy to reduce the exploration space, and it is more effective compared to existing methods.
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Abstract: To improve the observability in the post-silicon validation, how to select the limited trace signals effectively for the data acquisition is the focus. This paper proposes an automated trace signal selection algorithm, which uses the pruning-based strategy to reduce the exploration space. The experiments indicate that the proposed algorithm can bring higher restoration ratios, and it is more effective compared to existing methods.
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Citations
Trace signal selection methods for post silicon debugging
Shridhar Choudhary,Amir Masoud Gharehbaghi,Takeshi Matsumoto,Masahiro Fujita +3 more
- 01 Oct 2015
TL;DR: This paper introduces a new signal selection that tries to improve the selection by swapping the FFs that are going to be traced and introduces a hardware implementation of the method that is more than 3 orders of magnitude faster than software-based swapping.
4
•Journal Article
Trace Signal Selection Methods for Post Silicon Debugging (VLSI設計技術)
TL;DR: In this paper, the authors introduce a new signal selection that tries to improve the selection by swapping the flip-flops that are going to be traced, which is more than 3 orders of magnitude faster than software-based swapping.
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Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug
Ho Fai Ko,Nicola Nicolici +1 more
TL;DR: This paper presents accelerated algorithms for restoring circuit state elements from the traces collected during a debug session, by exploiting bitwise parallelism and introduces new metrics that guide the automated selection of trace signals, which can enhance the real-time observability during in-system debug.
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Trace signal selection for visibility enhancement in post-silicon validation
TL;DR: This paper proposes an automated trace signal selection strategy that is able to dramatically enhance the visibility in post-silicon validation and experimental results show that the proposed technique is more effective than existing solutions.
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TL;DR: This paper describes the sometimes exhilarating, sometimes depressing, and always challenging job of leading-edge microprocessor debug, the flows, tools and methods used to perform debug, and includes case studies of actual bugs from recent processors.
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Automated trace signals identification and state restoration for improving observability in post-silicon validation
Ho Fai Ko,Nicola Nicolici +1 more
- 10 Mar 2008
TL;DR: An automated method is introduced for improving the utilization of the on-chip storage, by identifying a small set of trace signals from which a large number of states can be restored using a compute-efficient algorithm.
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