Patent
Product manufacturing process management method and management system
Honchi Akio,Takashi Sakurai,Tetsuo Horiuchi,Shigeru Suzuki +3 more
- 07 Feb 2003
1
TL;DR: In this paper, a product manufacturing process management method and management system for use in a manufacturing process in which at least one of preprocess groups and following postprocess groups is composed of a plurality of process groups, that can optimize the whole manufacturing process at any given time and fully reduce manufacturing cost even when there is a capacity difference in manufacturing facilities used in the process groups.
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Abstract: PROBLEM TO BE SOLVED: To provide a product manufacturing process management method and management system, for use in a product manufacturing process in which at least one of preprocess groups and following postprocess groups is composed of a plurality of process groups, that can optimize the whole manufacturing process at any given time and fully reduce manufacturing cost even when there is a capacity difference in manufacturing facilities used in the process groups. SOLUTION: From an information terminal installed in each process group, the system collects, over a network, profit speed indication data calculated based on information on a bottleneck process in each process group of the plurality of process groups. Using the profit speed indication data on each process group, the system finds an optimum combination of the plurality of process groups that maximize the profit of the whole manufacturing process. Then over the network, the system provides the information terminal, installed in each process group, with the information on the optimum combination to manage the manufacturing process composed of the plurality of processes.
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Citations
Patent
Manufacture managing method in semiconductor manufacturing plant
Okoda Toshiyuki,Takahashi Atsushi +1 more
- 17 Jul 2008
TL;DR: In this paper, a new added value rate expressed by an expression (3): [added value rate=(unit price of semiconductor product - direct material cost - expense arising from outside manufacture) ÷ number of masks of semiconductors] is calculated at every semiconductor item, and the manufacture priority of a plurality of products is decided using the added value rates as an index.