Patent
Processor for testing electronic devices
Na Yun-Sung,Park Su-Chang,Lim Chea-Kwang,Kim Jae-Ho +3 more
- 01 Mar 2019
TL;DR: In this article, a processor for testing electronic devices is presented, where a delivery channel is used to deliver a test tray from a test room to a cooling room, which is divided into a first region and a second region, wherein the length of the second region is shorter than the length in the first region.
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Abstract: The invention relates to a processor for testing electronic devices. A delivery channel, which is used to deliver a test tray from a test room to a cooling room, is divided into a first region and a second region; wherein the length of the second region is shorter than the length of the first region. Before the first region is opened, the holding part of a holding member that is arranged on a second delivery device is moved to the test room through the second region in advance before the test starts. According to the technical scheme, when a test is finished, a test tray can be delivered fromthe test room to the cooling room, the circulation time of the test tray is shortened, and finally the efficiency of the processor is improved.
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References
Patent
System and method for testing semiconductor devices
Lee Soo Chan,Sun Young Kyun,Kim Hyun Ho,Byeong-Chun Lee,Jun Ho Lee,Jong-Cheol Lee,Je-hyoung Ryu,Tae-Gyu Kim,Soon-kyu Yim +8 more
- 03 Mar 2004
TL;DR: In this article, a stacker for stacking un-tested devices and at least one user tray sender for stacking tested devices, the user tray functions being interchangeable during stacker operation.
33
Patent
Tester for semiconductor devices and test tray used for the same
Akihiko Ito,Kobayashi Yoshihito,Masuo Yoshiyuki,Tsuyoshi Yamashita +3 more
- 02 Jul 1998
TL;DR: An IC tester capable of shortening the time required until the testing of all the IC's finishes, wherein the depths (lengths in the direction of a Y-axis) of a thermostatted tank (4) and an exit chamber (5) are increased by a size substantially corresponding to the width (length of a shorter side) of rectangular testing tray (3), and two parallel test tray transfer paths extending from a soaking chamber (41) in the tank(4) to the exit chamber(5) via a test section (42), or a wide transfer path capable
23
Patent
Handler and part inspecting apparatus
Masami Maeda,Toshioki Shimojima +1 more
- 12 Feb 2013
TL;DR: In this paper, a handler includes a storage tank which stores liquid nitrogen, supply channels which supply refrigerant from the storage tank to inner passages of a first shuttle, a valve which opens and closes the supply channel, and a heat exchanger which has vaporization chambers with larger flow path cross-sectional areas than those of the supply channels.
14
Patent
Test handler and operation method thereof
Jae-gyun Shim,Yun-Sung Na,In-Gu Jeon,Tae-Hung Ku,Dong-Han Kim +4 more
- 15 Dec 2006
TL;DR: In this paper, a posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber.
12
Patent
Electronic component testing equipment and method of testing electronic component
Yuji Kaneko,Kazuyuki Yamashita +1 more
- 21 Dec 2006
TL;DR: In this paper, the authors proposed a means for solving the problem of test tray stagnation by providing an electronic component testing equipment, and a method of testing electronic components, capable of shortening any time loss occurring in test trays stagnation.
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