Journal Article10.1016/J.ULTRAMIC.2010.09.008
Precession electron diffraction using a digital sampling method.
TL;DR: A software-based method for collecting precession electron diffraction patterns is described, which resembles the sampling of a conventional PED pattern and can be used for structure solution and refinement with reasonably good R-values.
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About: This article is published in Ultramicroscopy. The article was published on 01 Dec 2010. The article focuses on the topics: Precession electron diffraction.
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Citations
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Advances in Imaging and Electron Physics
Peter W. Hawkes
- 01 Jan 1998
TL;DR: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electro-Magnetic Physics (AEEE and EEE), and advances in Optical and Electro Electron Microscopy (OEM) as mentioned in this paper.
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Structural Determination of Ordered Porous Solids by Electron Crystallography
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Quantitative characterization of the microstructure and properties of nanocrystalline WC–Co bulk
TL;DR: In this article, the effect of microstructure on the mechanical properties was analyzed in terms of the correlations between Co distribution, Σ2 boundary fraction and WC grain contiguity.
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Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science
TL;DR: Precessionenhanced diffraction (PED) as mentioned in this paper is a transmission electron microscopy technique that allows for pseudo-kinematical diffraction conditions to occur using collected spot patterns.
42
Aberration-compensated large-angle rocking-beam electron diffraction
TL;DR: Results obtained by a recently developed self-calibrating acquisition software which compensates for aberration-induced probe shifts during the acquisition of LARBED patterns and keeps the probe within a few nm, while covering a tilt range from 0 to 100 mrad.
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References
A short history of SHELX
TL;DR: This paper could serve as a general literature citation when one or more of the open-source SH ELX programs (and the Bruker AXS version SHELXTL) are employed in the course of a crystal-structure determination.
Double conical beam-rocking system for measurement of integrated electron diffraction intensities
R. Vincent,Paul A. Midgley +1 more
TL;DR: In this article, a double conical scanning system was designed to collect a large data set of integrated intensities that were more suitable for structure determination by electron diffraction, both by removing excitation errors due to curvature of the Ewald sphere and also by reducing non-systematic dynamical effects.
718
Towards automated diffraction tomography: part I--data acquisition.
TL;DR: An experimental software module has been developed for the Tecnai microscope for such an automated diffraction pattern collection while tilting around the goniometer axis that allows automated recording of diffraction tilt series from nanoparticles with a size down to 5nm.
510
•Book
Advances in Imaging and Electron Physics
Peter W. Hawkes
- 01 Jan 1998
TL;DR: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electro-Magnetic Physics (AEEE and EEE), and advances in Optical and Electro Electron Microscopy (OEM) as mentioned in this paper.
308
Collecting 3D electron diffraction data by the rotation method
TL;DR: In this article, a new method for collecting complete three-dimensional electron diffraction data is described, which is collected by combining electron beam tilt at many very small steps, with rotation of the crystal in a few but large steps.