Journal Article10.1021/CR980130E
Near-field scanning optical microscopy.
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About: This article is published in Chemical Reviews. The article was published on 01 Jan 1999. The article focuses on the topics: Near-field scanning optical microscope.
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Citations
Probing Semiconductor Properties with Optical Scanning Tunneling Microscopy
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TL;DR: In this article, the authors combine scanning tunneling microscopy (STM) with optical methods to unravel the localized optoelectronic properties of semiconductors under realistic electric and optical fields, down to the nanoscale.
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Error signal artifact in apertureless scanning near-field optical microscopy
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TL;DR: In this article, the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy is described experimentally and modeled by electromagnetic calculations based on the finite element method.
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TL;DR: A numerical analysis of the interaction between novel scanning near-fleld optical microscopy probes based on an asymmetric structure and a single ∞uorescent molecule is presented in this paper.
Fluorescent Multifunctional Organic Nanoparticles for Drug Delivery and Bioimaging: A Tutorial Review
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TL;DR: Fluorescent organic nanoparticles (FONs) are a family of nanostructures constituted by organic components that emit light in different spectral regions upon excitation, due to the presence of organic fluorophores as discussed by the authors .
Hybrid near-field scanning optical microscopy tips for live cell measurements
TL;DR: In this paper, a near-field scanning optical microscopy (NSOM) probe that enables high-resolution imaging of living cells under physiological buffered conditions is presented, where the hybrid design combines a conventional fiber optic near field probe with a standard atomic force microscopy cantilever.
References
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Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit
Eric Betzig,Jay K. Trautman +1 more
TL;DR: The near-field optical interaction between a sharp probe and a sample of interest can be exploited to image, spectroscopically probe, or modify surfaces at a resolution inaccessible by traditional far-field techniques, resulting in a technique of considerable versatility.
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Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale
TL;DR: A near-field probe has been developed that yields a resolution of ∼12 nm (∼λ/43) and signals ∼104- to 106-fold larger than those reported previously and image contrast is demonstrated to be highly polarization dependent.
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