Patent
Methods and systems for using phase plates
Dyck Dirk Van
- 20 Sep 2009
3
TL;DR: In this article, a method for obtaining wave function data from microscope measurements is described, where the data are acquired over predetermined image recording times and a phase shift induced by the phase inducing means is kept constant.
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Abstract: A method (100) and system are described for obtaining wave function data from microscope measurements. The method comprises receiving (110) microscope image intensity data acquired using a phase inducing means whereby the data are acquired over predetermined image recording times and whereby a phase shift induced by the phase inducing means is kept constant. The method furthermore comprises extracting (130) wave function data from the microscope image intensity data acquired over predetermined image recording times, whereby the predetermined image recording times are function of a phase shift angle θ . A corresponding transmission microscope and corresponding computer related products also are disclosed.
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Citations
Patent
Method of investigating the wavefront of a charged-particle beam
Bart Jozef Janssen,Gijs van Duinen,Uwe Luecken,Ross Savage,Stephanus H.L. van den Boom,Ivan Lazic +5 more
- 17 Dec 2014
TL;DR: In this paper, a wavefront of a charged-particle beam that is directed from a source through an illuminator so as to traverse a sample plane and land upon a detector, an output of the detector being used in combination with a mathematical reconstruction technique so that calculate at least one of phase information and amplitude information for the wavefront at a pre-defined location along its path to the detector.
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Methods and Systems for Material Characterization
Dyck Dirk Ernest Maria Van,Fu-Rong Chen +1 more
- 29 May 2014
TL;DR: In this article, a wave function representative of the object detected at a detection surface of a detection system for detecting the wave function, deriving at least two spatial frequencies of the detected wave function and deriving for each of the at least 2 spatial frequencies at least a phase based on the obtained wave function.
1
References
Patent
Phase-contrast electron microscope and phase plate therefor
Takao Matsumoto,Nobuyuki Osakabe,Akira Tonomura +2 more
- 18 Dec 1996
TL;DR: In this paper, a phase-contrast electron microscope can be realized which includes a phase plate (100) corresponding to an electron beam, and which permits observing a phase object with contrast.
45
Atomic structure imaging of L10-type FePd nanoparticles by spherical aberration corrected high-resolution transmission electron microscopy
TL;DR: In this article, the atomic structure of FePd nanoparticles has been studied by spherical aberration (Cs) corrected high-resolution transmission electron microscopy, and the periodic arrangement of atoms arising from chemical order is clearly seen as bright contrast due to the small negative value of corrected Cs.
30
Development of real-time defocus-modulation-type active image processing (DMAIP) for spherical-aberration-free TEM observation
Toshiyuki Ando,Yoshifumi Taniguchi,Yoshizo Takai,Yoshihide Kimura,Ryuichi Shimizu,Takashi Ikuta +5 more
TL;DR: In this paper, a real-time defocusmodulation-type active image processing (DMAIP) was developed for spherical aberration-free observations under Transmission Electron Microscope (TEM) by real time defocus-modulation, which enables both rapid through-focusing and functionized irradiation-time control to be performed.
17
Contrast Transfer Function Design by an Electrostatic Phase Plate
W-K Hsieh,E Anderson,Gerd Benner,Moon Jeong Park,Enrique D. Gomez,Nitash P. Balsara,C F Kisielowski +6 more
TL;DR: Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 - August 9, 2007 as mentioned in this paper. But this paper is not related to our work.
3
New developments in phase Contrast Transmission Electron Microscopy with Electrostatic Phase Plate
Damien Alloyeau,WK Hsieh,E Anderson,Gerd Benner,Moon Jeong Park,Enrique D. Gomez,Nitash P. Balsara,C F Kisielowski +7 more
TL;DR: Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 - July 30, 2009 as discussed by the authors, is presented in this paper.