Patent
Method for selecting optimal semiconductor device temperature and humidity combined stress acceleration model
Huang Wei,Jun Luo,Liu Fan,Liu Huahui,Fu Xiaojun,Liu Luncai +5 more
- 03 Dec 2014
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TL;DR: In this paper, a method for selecting an optimal semiconductor device temperature and humidity combined stress acceleration model is presented. But the method is mainly applied to the field of semiconductor reliability evaluation.
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Abstract: The invention discloses a method for selecting an optimal semiconductor device temperature and humidity combined stress acceleration model The method includes the steps of screening out qualified samples, grouping the qualified samples, conducting normal stress degeneration testing on one of the groups, conducting acceleration degeneration testing on the other five groups, periodically detecting and recording possible sensitive parameters of the samples, determining the sensitive parameters of the tested samples and degeneration track models of the sensitive parameters, conducting extrapolation to obtain the pseudo service life of each tested sample, determining the distribution types of the pseudo service life, conducting fitting to obtain distribution parameters of the distribution types, calculating the average service life of the samples under the normal stress degeneration test and the average service life of the samples under the acceleration stress test, calculating model parameters and acceleration factors of a temperature and humidity combined stress acceleration model to be evaluated, conducting extrapolation to obtain the service life of the samples under the normal temperature and humidity stress condition, comparing the average service life of the samples with the service life, obtained through extrapolation, of the samples, and determining the model with the service life closest to the average service life as the optimal model The method is reasonable in test scheme design, scientific in analysis method and capable of accurately judging the optimal temperature and humidity combined stress acceleration model, and is mainly applied to the field of semiconductor device reliability evaluation
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Citations
Patent
Method for determining the optimal test time of energy-saving LED lamp accelerated life test
Zhang Jianping,Chen Wenlong,Deng Lixin +2 more
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TL;DR: In this article, a method for determining the optimal test time of an energy-saving LED lamp accelerated life test is proposed, which is based on a Weibull function and a least square method.
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Xie Chuanning,Ying Hua +1 more
- 21 Sep 2016
TL;DR: In this paper, an accelerated degradation test based method and system for rapid prediction of PCB insulation life is proposed, which comprises the following steps: 1) carrying out a bias stress accelerated degeneration test to a plurality of PCBs under a high temperature and high humidity condition, and collecting the surface insulation resistance values of the PCBs; 2) fitting PCBs to obtain a performance degradation track model and calculating the pseudo-failure life of each PCB according to the performance degradation tracker model; 3) constructing a bias-stress acceleration model, and calculating to-be-estimated
2
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Satellite element service life evaluation method based on aging test data before assembly
Fu Guicui,Zhong Ling,Cheng Yu,Ma Cheng +3 more
- 07 Dec 2016
TL;DR: In this article, a satellite element service life evaluation method based on aging test data before assembly is proposed, which consists of the steps: starting with a failure mode and a failure mechanism in the actual application process of the satellite element through an accelerated degradation test theory model and combining with a space application environment, and building the degradation tracks of all electrical performances in the high-temperature aging test.
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Zhang Yin,Zhu Binruo,Wang Xingang,Jiang Jianfeng,Gu Zhen,Zhu Zheng +5 more
- 18 Sep 2018
TL;DR: In this article, an electric energy meter life evaluation method based on accelerated degradation test is proposed, which comprises the following steps: 1, acquiring electric energy meters accelerateddegradation test data, and estimating the distributed parameter values of a degradation path model of the electric meter degradation characteristic quantity under different stress levels.
1
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Optimization method for temperature cyclic stress acceleration model of semiconductor device
Wu Zhaoxi,Luo Jun,Qiu Zhongwen +2 more
- 16 Feb 2018
TL;DR: In this article, an optimization method for a temperature cyclic stress acceleration model of a semiconductor device, and belongs to the field of integrated circuits, is presented. And the method comprises the steps of performing a normal stress degradation test on a group of samples by utilizing a cyclic stressed, and performing an accelerated degradation test by utilizing anincreased constant temperaturecyclic accelerated stress; performing detection and determination on sample sensitive parameters every a certain cyclic frequency, obtaining a degradation path model, and a pseudo-life and a distribution type, and applying fitting to obtain distribution parameters.
1
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Accelerated degradation test prediction method based on fuzzy theory
Li Xiaoyang,Fuqiang Sun,Jiang Tongmin,Tingting Huang +3 more
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TL;DR: In this paper, an accelerated degradation test prediction method based on fuzzy theory is proposed, which comprises the following steps: collecting test data, performing the analysis of regression aiming at performance degradation data under each stress level, extrapolating the performance degradation rate of the product under a normal stress level; estimating a diffusion coefficient sigma in an excursion Brownian motion with drift by adopting a maximum likelihood estimation method; and predicting the life and reliability predication model based on the fussy theory.
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Patent
Method for predicting service life of product by accelerated degradation testing based on degenerate distribution non-stationary time series analysis
Li Wang,Xiaoyang Li,Tongmin Jiang +2 more
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TL;DR: In this article, a method for predicting service life of a product by an accelerated degradation testing based on degradation distribution non-stationary time series analysis is presented, which comprises the following steps of: 1, acquisition and preprocessing of test data; 2, parameter estimation of degradation distribution; 3, time series modeling of degradation distributions parameters; 4, accelerated degradation modeling based on the degradation distribution, and 5, service life prediction based on degraded distribution.
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Patent
Prediction method for q-precentile life of intelligent meter
Sitong Wang,Hui Zhou,Wei Song,Zhonglin Yi,Lixia Zhou,Xiaolei Zhu,Ying Liu,Lin Gan,Hanji Ju +8 more
- 03 Oct 2012
TL;DR: In this article, a prediction method for the q-precentile life of an intelligent meter was proposed, which relates to the technical field of reliability estimation of accelerated degradation data.
24
Patent
Method for testing accelerated life of electronic product based on life-stress model
Weiwei Hu,Bangyan Qi,Yufeng Sun,Guangyan Zhao,Xiaoxue Ding,Pengzhou Zheng +5 more
- 23 Nov 2011
TL;DR: In this paper, a method for testing the accelerated life of an electronic product based on a life-stress model is proposed, which comprises the following steps of: 1, defining the life characteristics of a sample; 2, defining failure criteria; 3, performing accelerated life test of the maximum stress combination; 4, performing the other combinations, namely performing the test of other four different groups of stress combinations except for the maximum stressed combination, and 5, processing failure data, namely fitting a weibull distribution model of total life of all groups of test samples by a Weibull
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Patent
Method for evaluating long life of component
Wang Qunyong,Chen Dongmei,Yang Hui,Bai Hua,Zhengyu Zhong,Wenzhang Wu,Chen Yu,Yanfang Liu,Yan Song +8 more
- 27 Jun 2012
TL;DR: In this article, a method for evaluating the long life of a component is proposed, which comprises the following steps of: analyzing characteristics, an application platform and an application environment of the component; initially determining a stress level and sensitive parameters of a test; determining an application sequence of stress factors, responding to an analytical method for the sensitiveparameters, and determining test equipment; performing an official test, namely recording sensitive parameter values of an accelerated life test at certain time intervals to display changes of the sensitive parameters.
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