Patent
Method for detecting high-density packaging electronic assembly emissivity
He Xiaoqi,Feng Jingdong,Song Fangfang,Ping Lai,En Yunfei +4 more
- 26 Mar 2014
2
TL;DR: In this article, a method for detecting high-density packaging electronic assembly emissivity is proposed, which comprises the step of controlling the temperature of a temperature control box to enable an electronic assembly to be stabilized around the preset value.
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Abstract: The invention discloses a method for detecting the high-density packaging electronic assembly emissivity. The method comprises the step of controlling the temperature of a temperature control box to enable the temperature of an electronic assembly to be stabilized around the preset value, the step of acquiring reflected apparent temperature of components to be detected, the step of serving the acquired reflected apparent temperature of the components to be detected as compensation to the environment reflected temperature of the components to be detected, the step of respectively adjusting the emissivity of the components to be detected and detecting the temperature of the components to be detected, and the step of serving the adjustment value of the emissivity as the detecting value of the emissivity of the components to be detected when the temperature of the components to be detected is equal to the preset value. The infrared thermography detection mode and the reflected temperature compensation control technology are adopted in the method, the apparent temperature and the actual temperature of the components inside the electronic assembly are effectively detected, the emissivity of the components to be detected can be detected and modified by compensating the reflected temperature of the components to be detected, and the purpose of detecting the emissivity of the electronic assembly which is assembled in a high-density mode and is complex in packaging structure is achieved.
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Citations
Patent
Radiation rate control device and radiation rate control method
Wang Hao
- 31 Jul 2018
TL;DR: In this article, a radiation rate control device was proposed to determine the second radiation rate of the measured object according to the corresponding relation of first analysis data and the radiation rate. But this method is not suitable for the measurement application field, since the radiation rates of several kinds of materials are changed along with the change of the temperature.
2
Patent
High-precision testing method for infrared emittance
He Yingfeng,Deng Lewu,Wei Ping,Wang Rui,Wu Jie,Zhang Lei +5 more
- 19 Mar 2019
TL;DR: In this paper, a high-precision testing method for infrared emittance is presented, in which a standard reference black body is accurately moved to be within a view field range of a radiometer to be measured, avoiding that ambient environment temperature changes and stray light have bad influences on testing results, and the precision of testing is improved; the mechanical device is a mechanical arm capable of conducting accurate positioning on automatic control.
1
References
Patent
Measuring system and method for measuring object emissivity
Qu Huiming,Yuan-yuan Li,Chen Qian,Gu Guohua,Qi Zheng,Cao Dan,Liu Wenjun,Gong Jingtang,Huang Yuan +8 more
- 24 Apr 2013
TL;DR: In this article, a measuring system for measuring the object emissivity consisting of a detector, a radiation source and a spectroscope is presented, where the detector is placed in the same light path with a measured object.
16
Patent
Three-dimensional cpc type radiometer
Takeo Saito,武雄 齋藤 +1 more
- 06 Feb 2002
TL;DR: In this article, the authors proposed the radiometer having a structure using a window having selective transmissivity such as being high in transmissivities in a wave length area of the radiation being a measuring object for a cover material by arranging a plurality of fine three-dimensional composite parabolic condensing (CPC) type reflecting mirrors in the whole sphere or the whole semispherical direction.
6
Patent
Nadir Emissive Hyperspectral Measurement Operation (NEHMO)
Nielson Wade Schulenburg,David W. Warren,Donald J. Rudy,Michael G. Martino,Mark Alan Chatelain,Michael Arthur Rocha +5 more
- 01 Jun 2010
TL;DR: In this paper, a method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissive and/or emissively configurations.
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