Journal Article10.1103/PHYSREVB.53.16027
Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening.
H. K. Kim,King-Ning Tu +1 more
493
TL;DR: In this article, a kinetic analysis of the soldering reaction accompanied by the ripening reaction is given, and a reasonable agreement has been obtained between the calculated scallop-grain growth based on kinetic analysis and the experimentally measured values.
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Abstract: The wetting reaction of molten eutectic SnPb on Cu leads to Cu-Sn intermetallic compound formation, but not compounds of Cu-Pb since they do not exist. Cu-Sn compounds do not form layered structures between the solder and Cu, rather the ${\mathrm{Cu}}_{6}$${\mathrm{Sn}}_{5}$ phase has grown as scalloplike grains into the molten solder. The scalloplike grains grow larger but fewer with time, indicating that a ripening reaction has occurred among them. However, the ripening is not a constant volume process since it is accompanied by the soldering reaction. Between the scallop grains, there are molten solder channels extending nearly all the way to the Cu interface. In aging, these channels serve as fast diffusion and dissolution paths of Cu in the solder to feed the reaction. A kinetic analysis of the soldering reaction accompanied by the ripening reaction is given. In the analysis, the growth of the scalloplike grains is supplied by two fluxes: the flux of interfacial reaction and the flux of ripening. The latter was formulated by the Gibbs-Thomson equation. The former was obtained by measuring the rate of consumption of Cu in the reaction. The measurement was carried out by determining the change of the total volume of scalloplike grains (and in turn, the Cu content in the grains) as a function of time and temperature. A reasonable agreement has been obtained between the calculated scallop-grain growth based on kinetic analysis and the experimentally measured values. A discussion of the Cu consumption rate is given, since it is important for applications in electronic packaging technology. \textcopyright{} 1996 The American Physical Society.
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Citations
Growth of intermetallic compounds in the Sn-9Zn/Cu joint
C. S. Lee,Fuh-Sheng Shieu +1 more
TL;DR: In this article, the authors studied the microstructure of the Sn-9Zn/Cu joint in soldering at temperatures ranging from 230°C to 270°C, and showed that the growth of the mechanism of intermetallic compound (IMC) formation is controlled by ripening.
On the mechanism of the binary Cu/Sn solder reaction
TL;DR: In this paper, the solder reaction of Cu and molten pure Sn is studied by scanning and transmission electron microscopy, and the intermetallic Cu6Sn5 product is formed in a scallop-like morphology and a growth kinetic proportional to the cube root of time is found.
Investigation on growth of the orientation-preferred Cu6Sn5 on (001)Cu during the temperature-increased multiple reflow process
TL;DR: In this article, a temperature-increased multiple reflow process was designed and utilized to investigate the grain rotation and coarsening behavior of orientation-preferred Cu6Sn5 formed at the Sn-3Ag/(001)Cu interface.
Growth behaviors of intermetallic compounds at Sn–3Ag–0.5Cu/Cu interface during isothermal and non-isothermal aging
TL;DR: In this paper, the morphology and growth mechanism of intermetallic compound (IMC) layer at Sn-3Ag-0.5Cu/Cu interface during isothermal aging, thermal cycling and thermal shock were investigated by microstructural observations and phase analysis.
Investigation of the Growth of Intermetallic Compounds Between Cu Pillars and Solder Caps
TL;DR: In this article, the growth of intermetallic compounds (IMC) during thermal cycling, an accelerated method of testing the service environment of electronic devices, was studied by use of focused ion beam-scanning electron microscopy.
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Principles of electronic packaging
Donald P. Seraphim,Ronald Lasky,Che-Yu Li,Peter A. Engel +3 more
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