Journal Article10.1103/PHYSREVB.53.16027
Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening.
H. K. Kim,King-Ning Tu +1 more
493
TL;DR: In this article, a kinetic analysis of the soldering reaction accompanied by the ripening reaction is given, and a reasonable agreement has been obtained between the calculated scallop-grain growth based on kinetic analysis and the experimentally measured values.
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Abstract: The wetting reaction of molten eutectic SnPb on Cu leads to Cu-Sn intermetallic compound formation, but not compounds of Cu-Pb since they do not exist. Cu-Sn compounds do not form layered structures between the solder and Cu, rather the ${\mathrm{Cu}}_{6}$${\mathrm{Sn}}_{5}$ phase has grown as scalloplike grains into the molten solder. The scalloplike grains grow larger but fewer with time, indicating that a ripening reaction has occurred among them. However, the ripening is not a constant volume process since it is accompanied by the soldering reaction. Between the scallop grains, there are molten solder channels extending nearly all the way to the Cu interface. In aging, these channels serve as fast diffusion and dissolution paths of Cu in the solder to feed the reaction. A kinetic analysis of the soldering reaction accompanied by the ripening reaction is given. In the analysis, the growth of the scalloplike grains is supplied by two fluxes: the flux of interfacial reaction and the flux of ripening. The latter was formulated by the Gibbs-Thomson equation. The former was obtained by measuring the rate of consumption of Cu in the reaction. The measurement was carried out by determining the change of the total volume of scalloplike grains (and in turn, the Cu content in the grains) as a function of time and temperature. A reasonable agreement has been obtained between the calculated scallop-grain growth based on kinetic analysis and the experimentally measured values. A discussion of the Cu consumption rate is given, since it is important for applications in electronic packaging technology. \textcopyright{} 1996 The American Physical Society.
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Citations
Dissolution behavior of Cu and Ag substrates in molten solders
TL;DR: In this article, the dissolution behavior of both Cu and Ag substrates in molten Sn, Sn-3.5Ag and Sn-37Pb solders was investigated at 300, 350, and 400°C, and it was shown that Sn-Zn alloys have a substantially lower dissolution rate than other solders.
29
In situ visualization of metallurgical reactions in nanoscale Cu/Sn diffusion couples
TL;DR: The evolution of Kirkendall voids in the nanowires demonstrates that Cu diffuses faster than Sn in IMCs, and leads to changes in the phase transformation pathway in the IMCs.
Secondary IMC formation induced by Kirkendall voiding in Cu/Sn–3.5Ag solder joints
Sung-Hwan Kim,Jin Yu +1 more
TL;DR: In this paper, the formation of multiple-layered Kirkendall voids at Cu/Sn/3.5Ag solder joints was investigated with the aid of cross-sectional scanning electron microscopy micrographs and schematic diagrams.
27
Mechanisms for Interfacial Reactions between Liquid Sn-3.5Ag Solders and Cu Substrates
TL;DR: In this article, the authors investigated the growth of intermetallics formed during soldering reactions between Sn-3.5Ag and Cu at temperatures ranging from 250°C to 375°C.
27
Structural and elastic properties of Cu6Sn5 and Cu3Sn from first-principles calculations
TL;DR: In this paper, the elastic properties of two tin-copper crystalline phases, the η′-Cu6Sn5 and e-Cu3Sn, which are often encountered in microelectronic packaging applications, were determined based on strain-energy relations using first-principles calculations.
27
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