Journal Article10.1103/PHYSREVB.53.16027
Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening.
H. K. Kim,King-Ning Tu +1 more
493
TL;DR: In this article, a kinetic analysis of the soldering reaction accompanied by the ripening reaction is given, and a reasonable agreement has been obtained between the calculated scallop-grain growth based on kinetic analysis and the experimentally measured values.
read more
Abstract: The wetting reaction of molten eutectic SnPb on Cu leads to Cu-Sn intermetallic compound formation, but not compounds of Cu-Pb since they do not exist. Cu-Sn compounds do not form layered structures between the solder and Cu, rather the ${\mathrm{Cu}}_{6}$${\mathrm{Sn}}_{5}$ phase has grown as scalloplike grains into the molten solder. The scalloplike grains grow larger but fewer with time, indicating that a ripening reaction has occurred among them. However, the ripening is not a constant volume process since it is accompanied by the soldering reaction. Between the scallop grains, there are molten solder channels extending nearly all the way to the Cu interface. In aging, these channels serve as fast diffusion and dissolution paths of Cu in the solder to feed the reaction. A kinetic analysis of the soldering reaction accompanied by the ripening reaction is given. In the analysis, the growth of the scalloplike grains is supplied by two fluxes: the flux of interfacial reaction and the flux of ripening. The latter was formulated by the Gibbs-Thomson equation. The former was obtained by measuring the rate of consumption of Cu in the reaction. The measurement was carried out by determining the change of the total volume of scalloplike grains (and in turn, the Cu content in the grains) as a function of time and temperature. A reasonable agreement has been obtained between the calculated scallop-grain growth based on kinetic analysis and the experimentally measured values. A discussion of the Cu consumption rate is given, since it is important for applications in electronic packaging technology. \textcopyright{} 1996 The American Physical Society.
read more
Chat with Paper
AI Agents for this Paper
Find similar papers on Google Scholar, PubMed and Arxiv
Write a critical review of this paper
Analyze citations of this paper to find unaddressed research gaps
Citations
Comparison of interfacial reactions of Ni and Ni–P in extended contact with liquid Sn–Bi-based solders
Jianfeng Li,Samjid H. Mannan,M.P. Clode,K. Chen,David C. Whalley,Changqing Liu,David A. Hutt +6 more
TL;DR: In this article, a time dependence of the form t 1/n with n ǫ > 3 was observed for the thickening kinetics of the Ni 3 Sn 4 scallops formed in both the Sn-58Bi/Ni and Sn- 58Bi-Ni-P systems.
59
Effects of In and Ni Addition on Microstructure of Sn-58BiSolder Joint
Omid Mokhtari,Hiroshi Nishikawa +1 more
TL;DR: In this article, the effect of adding In and Ni to Sn-58Bi solder on intermetallic compound (IMC) layers at the interface and the microstructure of the solder alloys were investigated by scanning electron microscopy and electron probe micro-analysis.
59
Effects of nano-Al2O3 particles on microstructure and mechanical properties of Sn3.5Ag0.5Cu composite solder ball grid array joints on Sn/Cu pads
TL;DR: In this paper, the interfacial microstructures and mechanical properties of SAC-XAl2O3 nano-composite solder balls on immersion Sn surface finished BGA joints after multiple reflows was investigated.
57
Extremely rapid grain growth in scallop-type Cu6Sn5 during solid–liquid interdiffusion reactions in micro-bump solder joints
TL;DR: In this paper, the authors proposed that the liquid solder wets the grain boundary between scallops and provides an extremely fast kinetic path of liquid channel for grain growth, which is a unique phenomenon observed in micro-bump solid joints.
57
Interfacial Reaction and Morphology Between Molten Sn Base Solders and Cu Substrate
TL;DR: In this paper, the morphologies and growth of intermetallic compounds between a molten Sn base solder and a Cu substrate were experimentally investigated, and it was shown that the thickness of the e(Cu 3 Sn) and η(Cu 6 Sn 5 ) compounds decreases with deceasing Sn content and that the order of the growth rate of the compounds on the Cu substrate are as follows: Sn-57(mass%)Bi < Sn-37Pb < Sn 3.5Ag < Sn < Sn 6.7Sb.
54
References
The kinetics of precipitation from supersaturated solid solutions
I.M. Lifshitz,V.V. Slyozov +1 more
TL;DR: In this paper, an analysis is made of the process whereby diffusion effects can cause the precipitation of grains of a second phase in a supersaturated solid solution, and the kinetics of this type of grain growth are examined in detail.
8.1K
Growth kinetics of planar binary diffusion couples: ’’Thin‐film case’’ versus ’’bulk cases’’
U. Gösele,King-Ning Tu +1 more
TL;DR: In this paper, it is proposed that interfacial reaction barriers in binary A/B diffusion couples lead to the absence of phases predicted by the equilibrium phase diagram, provided that the diffusion zones are sufficiently thin.
580
Kinetics of interfacial reaction in bimetallic CuSn thin films
King-Ning Tu,R. D. Thompson +1 more
TL;DR: In this paper, the formation of Cu6Su5 between Cu and Sn thin films at room temperature and of Cu3Sn between Cu6Sn5 and Cu at temperatures from 115° to 150°'C were measured by Rutherford backscattering spectroscopy and glancing-incidence X-ray diffraction.
470
•Book
Principles of electronic packaging
Donald P. Seraphim,Ronald Lasky,Che-Yu Li,Peter A. Engel +3 more
- 01 Jan 1989
362