Proceedings Article10.1109/ISQED.2003.1194734
Interoperability beyond design: sharing knowledge between design and manufacturing
D.R. Cottrell,T.J. Grebinski +1 more
- 24 Mar 2003
- pp 214-219
TL;DR: This paper discusses some of the rationale for the UDM and highlights the attributes of the OpenAccess technology that make it the ideal base on which to build an open industry UDM.
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Abstract: The nature of IC design is necessarily evolving to a more data-centric design flow in which EDA tools share a common information in a design database without the negative cost and quality impacts of data translation from sequential files. In support of this new paradigm, a collection of mainstream companies within the IC supply chain have sponsored the development of an open industry data model and application program interface for IC design tools, along with a database that fully implements this. This technology, called OpenAccess, is now available and being adopted by the IC design community. Another industry effort is in operation with the goal of greatly improving the cost and efficiency for IC photomasks. That effort is exploring a new paradigm similar in nature to OpenAccess in that a common data model and data access language is proposed. This data model would span both the design and mask-making communities, and possibly expand into wafer fabrication over time. Thus, it has become known as the Universal Data Model (UDM). This paper discusses some of the rationale for the UDM and highlights the attributes of the OpenAccess technology that make it the ideal base on which to build an open industry UDM.
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Citations
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References
Subwavelength lithography and its potential impact on design and EDA
Andrew B. Kahng,Y. C. Pati +1 more
- 01 Jun 1999
TL;DR: This tutorial paper surveys the potential implications of subwavelength optical lithography for new tools and flows in the interface between layout design and manufacturability and addresses the necessary changes in the design-to-manufacturing flow.
GDS-3 initiative: advanced design-through-chip infrastructure for subwavelength technology
Robert C. Pack,Mitchell D. Heins,Ahmad Chatila,Victor Vladimir Boksha,D. Cottrell,C. Neil Berglund,J. Hogan,F. James,T. Vucurevich,M. Bales,K. Shimasaki +10 more
- 11 Jul 2002
TL;DR: In this article, the authors discuss a simplifying infrastructure and various principles for reducing and managing the complexity of the IC design-to-silicon manufacturing interface, and conclude that the IC industry must broaden its development efforts and diversify investments to include those of building a robust and inherently simplifying interface infrastructure between design and manufacturing.
5
Anatomy of a Universal Data Model
Thomas J. Grebinski
- 24 Dec 2002
TL;DR: The burgeoning confluence of fractious design and manufacturing linguistics, terabyte/second intensive data paths, a finer need to delineate features nearly the size of atoms and the ongoing need to resolve a smaller subset of larger, more complex, design andManufacturing problems with more data and computational power, needs a comprehensive and common data model.
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