1. What have the authors contributed in "Instrumental developments for in-situ breakdown experiments inside a scanning electron microscope" ?
Fundamental understanding of breakdown phenomena is an important part of the CLIC feasibility study.. The present work concerns the experimental study of breakdown using Scanning Electron Microscopes ( SEMs ).. Moreover it is used to prepare cross sections of a voltage breakdown area in order to study the geometrical surface damages as well as the elemental composition of the breakdown.
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2. What is the accelerating field of the CLIC?
The3 high accelerating field of 100MV/m is generated by sending radio-frequency4 (rf) waves through specially designed accelerating structures.
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3. What is used to create surface corrugations?
A second electron microscope equipped with a Focused Ion Beam (FIB) is used to create surface corrugations and to sharpen the probe needle to a tip radius of about 50 nm.
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4. What is the purpose of the FIB?
A Focused Ion Beam (FIB) Dual80 Beam device (FEI Strata DB235) is applied as an essential part to optimise81 and understand the breakdown and tunnel-current experiments.
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